Complex Dielectric Constant of a Nematic Liquid Crystal Containing Two Types of Ions: Limit of Validity of the Superposition Principle

2009 ◽  
Vol 113 (44) ◽  
pp. 14747-14753 ◽  
Author(s):  
A. L. Alexe-Ionescu ◽  
G. Barbero ◽  
I. Lelidis
1961 ◽  
Vol 39 (3) ◽  
pp. 571-594 ◽  
Author(s):  
D. W. Davidson

Methods are described for the determination from experimental data of the parameters used in the skewed-arc representation in the complex dielectric constant plane of dielectric relaxation in liquids. Graphs give the frequency dependence of the real and imaginary parts of the dielectric constant predicted by the skewed-arc equation. Evidence, which includes an analysis of published data and of some new data, is presented for the frequent occurrence of this type of relaxation behavior in liquids. The resolution of the effects of different relaxation processes is discussed.The recent defect-diffusion model of Glarum is found to lead, under some conditions, to complex dielectric constant loci which are practically indistinguishable from skewed-arc loci over much of the frequency range of dispersion. It predicts departures from skewed-arc behavior at relatively high frequencies which are possibly related to experimentally observed departures.It is concluded that skewed-arc characteristics arise from the presence of co-operative relaxation processes, possibly aided by the diffusion of disordered regions, in which the individual mechanisms of relaxation cannot be resolved by application of the superposition principle.


1976 ◽  
Vol 31 (3-4) ◽  
pp. 283-287 ◽  
Author(s):  
N. V. S. Rao ◽  
P. R. Kishore ◽  
T. F. S. Raj ◽  
M. N. Avadhanlu ◽  
C. R. K. Murty

Molecular alignment in the nematic phase of p-methoxy benzylidene p′-n-butylaniline (MBBA) in the presence of electric and magnetic fields is investigated. The relative effectiveness of electric and magentic fields on the nematic liquid crystal MBBA is discussed. In the dielectric regime it is found that the threshold fields for chevron formation are considerably different from the threshold fields for inducing changes in the dielectric constant.


1994 ◽  
Vol 4 (2) ◽  
pp. 319-331 ◽  
Author(s):  
J.M Gilli ◽  
M. Morabito ◽  
T. Frisch

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