Evacuation of Counteranions from Langmuir Monolayers of Double-Tailed Quaternary Ammonium Ions into Subphase at High Surface Pressures as Studied by Total Reflection X-ray Absorption Spectrometry

2009 ◽  
Vol 113 (28) ◽  
pp. 12476-12482 ◽  
Author(s):  
Makoto Harada ◽  
Tetsuo Okada
Keyword(s):  
Quaternary Ammonium ◽  
High Surface ◽  
Langmuir Monolayers ◽  
Absorption Spectrometry ◽  
Total Reflection ◽  
Ammonium Ions ◽  
X Ray ◽  
Quaternary Ammonium Ions ◽  
X Ray Absorption

scholarly journals Extraction of SO3H-containing iron (III) complexes with quaternary ammonium ions

1968 ◽  
Vol 17 (5) ◽  
pp. 616-621 ◽  
Author(s):  
Hitoshi KOHARA ◽  
Nobuhiko ISHIBASHI ◽  
Akira YOSHIDA
Keyword(s):  
Quaternary Ammonium ◽  
Ammonium Ions ◽  
Quaternary Ammonium Ions

X–ray absorption fine structure (XAFS) of Si wafer measured using total reflection X–rays

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi
Keyword(s):  
Fine Structure ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption ◽  
Si Wafer
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