In situ Structural Characterization of Metal−Molecule−Silicon Junctions Using Backside Infrared Spectroscopy
2008 ◽
Vol 112
(36)
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pp. 14021-14026
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2012 ◽
Vol 544
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pp. 34-38
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1990 ◽
Vol 112
(12)
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pp. 4821-4830
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2019 ◽
Vol 5
(4)
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pp. 457-467
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Keyword(s):
2020 ◽
Vol 92
(10)
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pp. 6806-6810
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