Polyelectrolyte Adsorption onto Oppositely Charged Interfaces: Image-Charge Repulsion and Surface Curvature

2012 ◽  
Vol 116 (32) ◽  
pp. 9838-9845 ◽  
Author(s):  
A. G. Cherstvy ◽  
R. G. Winkler
Keyword(s):  
Surface Curvature ◽  
Image Charge ◽  
Polyelectrolyte Adsorption ◽  
Oppositely Charged

Polymer Layer Ordering of Polyaniline Derivatives in Pled Devices: Surface Adsorption and Characterization

1997 ◽  
Vol 488 ◽  
Author(s):  
R. C. Advincula ◽  
W. Knoll ◽  
C. W. Frank ◽  
D. Roitman ◽  
R. Moon ◽  
...  
Keyword(s):  
Light Emitting Diode ◽  
Deposition Process ◽  
Film Structure ◽  
Hole Injection ◽  
Polyelectrolyte Adsorption ◽  
Light Emitting ◽  
Linear Behavior ◽  
Structure Morphology ◽  
Vis Spectroscopy ◽  
Oppositely Charged

AbstractThe fabrication and characterization of polyaniline (PANI) derivatives deposited on ITO coated glass is investigated as possible hole injection layers for MEH-PPV based polymer light emitting diode (PLED) devices. This involved multilayer ordering by the alternate polyelectrolyte adsorption of polyaniline and sulfonated poyaniline with an oppositely charged polyelectrolyte from solution. A combination of spectroscopic and microscopic techniques was utilized to determine the layer ordering, film structure, morphology, and homogeneity. The deposition process generally showed a linear behavior for all pairs as shown by ellipsometry and UV-vis spectroscopy. However, surface plasmon spectroscopy (SPS) and AFM revealed that thicker films are accompanied by increased surface roughness regardless of concentration. Comparison in performance was made between bare ITO and PANI or SPANI coated devices. Initial investigations of PLED performance showed significant improvements in lifetime and efficiency compared to bare ITO.

scholarly journals Modulation of Polyelectrolyte Adsorption on Nanoparticles and Nanochannels by Surface Curvature

2018 ◽  
Vol 122 (12) ◽  
pp. 6669-6677 ◽  
Author(s):  
Facundo M. Gilles ◽  
Fernando M. Boubeta ◽  
Omar Azzaroni ◽  
Igal Szleifer ◽  
Mario Tagliazucchi
Keyword(s):  
Surface Curvature ◽  
Polyelectrolyte Adsorption

Direct imaging of charge transfer

1996 ◽  
Vol 54 ◽  
pp. 680-681
Author(s):  
Yimei Zhu ◽  
J. Tafto
Keyword(s):  
Charge Transfer ◽  
Electron Diffraction ◽  
Scattering Amplitude ◽  
High Temperature Superconductors ◽  
Charge Carriers ◽  
Image Charge ◽  
Net Charge ◽  
Long Time ◽  
Electron Holes ◽  
First Time

The electron holes confined to the CuO2-plane are the charge carriers in high-temperature superconductors, and thus, the distribution of charge plays a key role in determining their superconducting properties. While it has been known for a long time that in principle, electron diffraction at low angles is very sensitive to charge transfer, we, for the first time, show that under a proper TEM imaging condition, it is possible to directly image charge in crystals with a large unit cell. We apply this new way of studying charge distribution to the technologically important Bi2Sr2Ca1Cu2O8+δ superconductors.Charged particles interact with the electrostatic potential, and thus, for small scattering angles, the incident particle sees a nuclei that is screened by the electron cloud. Hence, the scattering amplitude mainly is determined by the net charge of the ion. Comparing with the high Z neutral Bi atom, we note that the scattering amplitude of the hole or an electron is larger at small scattering angles. This is in stark contrast to the displacements which contribute negligibly to the electron diffraction pattern at small angles because of the short g-vectors.

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