Polarization Dependence of Raman Scattering from a Thin Film Involving Optical Anisotropy Theorized for Molecular Orientation Analysis

2012 ◽  
Vol 116 (23) ◽  
pp. 5560-5570 ◽  
Author(s):  
Yuki Itoh ◽  
Takeshi Hasegawa
2016 ◽  
Vol 71 (5) ◽  
pp. 901-910 ◽  
Author(s):  
Nobutaka Shioya ◽  
Shingo Norimoto ◽  
Naoki Izumi ◽  
Miyako Hada ◽  
Takafumi Shimoaka ◽  
...  

Infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a useful spectroscopic tool for revealing the molecular anisotropic structure in a thin film, which is used for the molecular orientation analysis of many functionalized organic thin films. Infrared pMAIRS provides both in-plane (IP) and out-of-plane (OP) vibrational mode spectra, which are influenced by the choice of the angles of incidence, i.e., angle set. To obtain quantitatively reliable pMAIRS spectra, therefore, the optimal angle set must be revealed. In a former study, an optimization study was carried out on a silicon substrate by using the band intensity ratio of the IP and OP spectra of highly oriented molecules in a thin film, which has a problem that the optimized results cannot be used for another substrate. In the present study, a totally new idea using an optically isotropic thin film as a standard sample is proposed to comprehensively explore the optimal angle set on various substrates: the band shift due to the Berreman effect of a strongly absorbing compound is used, instead of the band intensity. This new approach makes the pMAIRS calibration for various substrates a much easier task. With the optimal angle set, the molecular orientation angle in the film calculated by the pMAIRS spectra is also found to be reliable quantitatively. This technique opens a user-friendly way to a reliable molecular orientation analysis in an ultrathin film using IR pMAIRS.


Coatings ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 458
Author(s):  
Datai Hui ◽  
Shun Zhou ◽  
Changlong Cai ◽  
Shigeng Song ◽  
Zhentao Wu ◽  
...  

The growth mechanism of nanocolumnar silver thin film deposited on a smooth silicon substrate using electron beam evaporation process at an oblique angle was simulated with the Kinetic Monte Carlo method. Following the simulated silver nanostructured thin film, a further computational simulation was done using COMSOL for surface-enhanced Raman scattering effects. The simulation results were compared against corresponding experimental results, which demonstrated high agreement between simulation results and experimental data. It was found that as the incident deposition angle increased, the density of the Ag thin film significantly decreased and the surface roughness increased. When the incident deposition angle was at 75° and 85°, the resulting nanocolumnar structure was significantly tilted. For Ag thin films deposited at all investigated angles, surface-enhanced Raman scattering effects were observed. Particularly, the Ag nanocolumns deposited at 85° showed remarkable Surface-enhanced Raman Scattering effects. This was seen in both COMSOL simulations and experimental results: Enhancement factors were 2 × 107 in COMSOL simulation and 3.3 × 105 in the experiment.


2015 ◽  
Vol 106 (9) ◽  
pp. 092907 ◽  
Author(s):  
Purevdorj Munkhbaatar ◽  
Zsolt Marton ◽  
Baatarchuluun Tsermaa ◽  
Woo Seok Choi ◽  
Sung S. Ambrose Seo ◽  
...  

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