Molecular Rearrangement in a Zinc Stearate Langmuir Film Dependent on a Film Preparation Method Studied Using Polarization-Modulation Infrared Reflection Absorption Spectroscopy and X-ray Absorption Fine Structure

2012 ◽  
Vol 116 (10) ◽  
pp. 3148-3154 ◽  
Author(s):  
Maiko Muro ◽  
Makoto Harada ◽  
Tetsuo Okada ◽  
Takeshi Hasegawa
Keyword(s):  
Fine Structure ◽  
Preparation Method ◽  
Zinc Stearate ◽  
Polarization Modulation ◽  
Molecular Rearrangement ◽  
X Ray ◽  
Infrared Reflection Absorption Spectroscopy ◽  
Infrared Reflection ◽  
Film Preparation ◽  
X Ray Absorption

Extended Core Edge Fine Structure in the E.M.

1980 ◽  
Vol 38 ◽  
pp. 120-121
Author(s):  
R.D. Leapman
Keyword(s):  
Fine Structure ◽  
Electron Scattering ◽  
Inelastic Electron ◽  
High Resolution Imaging ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Core Electrons ◽  
Resolution Imaging ◽  
X Ray Absorption

Extended X-ray Absorption Fine Structure (EXAFS) analysis makes use of synchrotron radiaion to measure modulations in the absorption coefficient above core edges and hence to obtain information about local atomic environments. EXAFS arises when ejected core electrons are backscattered by surrounding atoms and interfere with the outgoing waves. Recently, interest has also been shown in using inelastic electron scattering1-4. Some advantages of Extended X-ray-edge Energy Loss Fine Structure (EXELFS) are: a) small probes formed by the analytical electron microscope give spectra from μm to nm sized areas, compared with mm diameter areas for the X-ray technique, b) EXELFS can be combined with other techniques such as electron diffraction or high resolution imaging, and c) EXELFS is sensitive to low Z elements with K edges from ˜200 eV to ˜ 3000 eV (B to Cl).

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