Lamellar Orientation and Crystallization Dynamics of Poly (l-Lactic Acid) Thin Films Investigated by In-Situ Reflection Absorption Infrared Spectroscopy

2011 ◽  
Vol 115 (40) ◽  
pp. 11548-11553 ◽  
Author(s):  
Ningjing Wu ◽  
Meichun Ding ◽  
Chenwei Li ◽  
Yuan Yuan ◽  
Jianming Zhang
Keyword(s):  
Thin Films ◽  
Lactic Acid ◽  
Infrared Spectroscopy ◽  
Lamellar Orientation ◽  
Reflection Absorption Infrared Spectroscopy ◽  
Crystallization Dynamics

Structural evolution of poly(lactic acid) upon uniaxial stretching investigated by in situ infrared spectroscopy

2016 ◽  
Vol 86 ◽  
pp. 262-269 ◽  
Author(s):  
Ranran Zhuo ◽  
Yanyan Zhang ◽  
Guili Li ◽  
Chunguang Shao ◽  
Yaming Wang ◽  
...  
Keyword(s):  
Lactic Acid ◽  
Infrared Spectroscopy ◽  
Structural Evolution ◽  
Poly Lactic Acid ◽  
Uniaxial Stretching ◽  
In Situ Infrared Spectroscopy

Spontaneously electrical solids in a new light

2015 ◽  
Vol 17 (32) ◽  
pp. 20971-20980 ◽  
Author(s):  
Jérôme Lasne ◽  
Alexander Rosu-Finsen ◽  
Andrew Cassidy ◽  
Martin R. S. McCoustra ◽  
David Field
Keyword(s):  
Thin Films ◽  
Nitrous Oxide ◽  
Infrared Spectroscopy ◽  
Electrical Properties ◽  
Structural Phase ◽  
Reflection Absorption Infrared Spectroscopy

Reflection–absorption infrared spectroscopy (RAIRS) of nitrous oxide (N2O) thin films is shown to provide an independent means of observing the spontelectric state; the first new structural phase of matter, with unique electrical properties, to have emerged in decades.

Atomic Layer Deposition of Cobalt Silicide Thin Films Studied by in Situ Infrared Spectroscopy

2015 ◽  
Vol 27 (14) ◽  
pp. 4943-4949 ◽  
Author(s):  
Karla Bernal-Ramos ◽  
Mark J. Saly ◽  
Ravindra K. Kanjolia ◽  
Yves J. Chabal
Keyword(s):  
Thin Films ◽  
Infrared Spectroscopy ◽  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Cobalt Silicide ◽  
Layer Deposition ◽  
In Situ Infrared Spectroscopy

Nucleation and Early Growth of Sputtered thin Films

1970 ◽  
Vol 28 ◽  
pp. 516-517
Author(s):  
Dudley M. Sherman ◽  
Thos. E. Hutchinson
Keyword(s):  
Thin Films ◽  
Electron Beam ◽  
Ion Beam ◽  
Ion Source ◽  
Water Cooling ◽  
Stages Of Growth ◽  
Lens Assembly ◽  
Microscope Technique ◽  
Ion Beam Sputter Deposition

The in situ electron microscope technique has been shown to be a powerful method for investigating the nucleation and growth of thin films formed by vacuum vapor deposition. The nucleation and early stages of growth of metal deposits formed by ion beam sputter-deposition are now being studied by the in situ technique.A duoplasmatron ion source and lens assembly has been attached to one side of the universal chamber of an RCA EMU-4 microscope and a sputtering target inserted into the chamber from the opposite side. The material to be deposited, in disc form, is bonded to the end of an electrically isolated copper rod that has provisions for target water cooling. The ion beam is normal to the microscope electron beam and the target is placed adjacent to the electron beam above the specimen hot stage, as shown in Figure 1.

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