Simple ZnO Nanowires Patterned Growth by Microcontact Printing for High Performance Field Emission Device

2011 ◽  
Vol 115 (23) ◽  
pp. 11435-11441 ◽  
Author(s):  
Hyun Wook Kang ◽  
Junyeob Yeo ◽  
Jin Ok Hwang ◽  
Sukjoon Hong ◽  
Phillip Lee ◽  
...  
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Microcontact Printing ◽  
Zno Nanowires ◽  
Patterned Growth ◽  
Emission Device

scholarly journals High-performance field emission device utilizing vertically aligned carbon nanotubes-based pillar architectures

AIP Advances ◽  
2018 ◽  
Vol 8 (1) ◽  
pp. 015117 ◽  
Author(s):  
Bipin Kumar Gupta ◽  
Garima Kedawat ◽  
Amit Kumar Gangwar ◽  
Kanika Nagpal ◽  
Pradeep Kumar Kashyap ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Field Emission ◽  
High Performance ◽  
Vertically Aligned Carbon Nanotubes ◽  
Aligned Carbon Nanotubes ◽  
Vertically Aligned ◽  
Emission Device

Patterned growth and field emission of ZnO nanowires

2006 ◽  
Vol 60 (4) ◽  
pp. 522-526 ◽  
Author(s):  
Yongsheng Zhang ◽  
Ke Yu ◽  
Shixi Ouyang ◽  
Ziqiang Zhu
Keyword(s):  
Field Emission ◽  
Zno Nanowires ◽  
Patterned Growth

Prospects for convergent beam electron diffraction with a 200kV cold field-emission transmission electron microscope

1991 ◽  
Vol 49 ◽  
pp. 466-467
Author(s):  
J W Steeds ◽  
R Vincent
Keyword(s):  
Field Emission ◽  
High Performance ◽  
Small Diameter ◽  
Convergent Beam Electron Diffraction ◽  
Zone Axis ◽  
Medium Voltage ◽  
Transmission Electron ◽  
Good Crystallinity ◽  
Special Modification ◽  
Convergent Beam

We review the analytical powers which will become more widely available as medium voltage (200-300kV) TEMs with facilities for CBED on a nanometre scale come onto the market. Of course, high performance cold field emission STEMs have now been in operation for about twenty years, but it is only in relatively few laboratories that special modification has permitted the performance of CBED experiments. Most notable amongst these pioneering projects is the work in Arizona by Cowley and Spence and, more recently, that in Cambridge by Rodenburg and McMullan.There are a large number of potential advantages of a high intensity, small diameter, focussed probe. We discuss first the advantages for probes larger than the projected unit cell of the crystal under investigation. In this situation we are able to perform CBED on local regions of good crystallinity. Zone axis patterns often contain information which is very sensitive to thickness changes as small as 5nm. In conventional CBED, with a lOnm source, it is very likely that the information will be degraded by thickness averaging within the illuminated area.

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