Effects of Processing Conditions on the Work Function and Energy-Level Alignment of NiO Thin Films

2010 ◽  
Vol 114 (46) ◽  
pp. 19777-19781 ◽  
Author(s):  
Mark T. Greiner ◽  
Michael G. Helander ◽  
Zhi-Bin Wang ◽  
Wing-Man Tang ◽  
Zheng-Hong Lu
Keyword(s):  
Thin Films ◽  
Energy Level ◽  
Work Function ◽  
Processing Conditions ◽  
Energy Level Alignment

Effects of defects and non-coordinating molecular overlayers on the work function of graphene and energy-level alignment with organic molecules

Carbon ◽  
2012 ◽  
Vol 50 (3) ◽  
pp. 851-856 ◽  
Author(s):  
Giyeol Bae ◽  
Janghwan Cha ◽  
Hoonkyung Lee ◽  
Wanjun Park ◽  
Noejung Park
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Organic Molecules ◽  
Energy Level Alignment

Energy-level alignment and work function shifts for thiol-bound monolayers of conjugated molecules self-assembled on Ag, Cu, Au, and Pt

2007 ◽  
Vol 442 (4-6) ◽  
pp. 390-393 ◽  
Author(s):  
Christopher D. Zangmeister ◽  
Laura B. Picraux ◽  
Roger D. van Zee ◽  
Yuxing Yao ◽  
James M. Tour
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Conjugated Molecules ◽  
Energy Level Alignment ◽  
Self Assembled

Dependence of substrate work function on the energy-level alignment at organic–organic heterojunction interface

2019 ◽  
Vol 58 (SB) ◽  
pp. SBBG06 ◽  
Author(s):  
Alexandre L. Foggiatto ◽  
Hiroki Suga ◽  
Yasuo Takeichi ◽  
Kanta Ono ◽  
Yoshio Takahashi ◽  
...  
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Energy Level Alignment

Electronic structures of 1-ML C84/Ag(111): Energy level alignment and work function variation

2017 ◽  
Vol 666 ◽  
pp. 23-27
Author(s):  
Peng Wang ◽  
Li-Li Zhao ◽  
Jin-Juan Zhang ◽  
Wen-Jie Li ◽  
Wei-Hui Liu ◽  
...  
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Electronic Structures ◽  
Energy Level Alignment

scholarly journals Image-force effects on energy level alignment at electron transport material/cathode interfaces

2020 ◽  
Vol 8 (1) ◽  
pp. 173-179 ◽  
Author(s):  
Yongzhen Chen ◽  
Xianjie Liu ◽  
Slawomir Braun ◽  
Ying Wang ◽  
Mats Fahlman
Keyword(s):  
Electron Transport ◽  
Energy Level ◽  
Work Function ◽  
Image Force ◽  
Energy Level Alignment

The work function of substrate can be sharply reduced by ETMs with an image-force induced double dipole.

Influence of the electrode work function on the energy level alignment at organic-organic interfaces

2007 ◽  
Vol 91 (20) ◽  
pp. 202108 ◽  
Author(s):  
Slawomir Braun ◽  
Michel P. de Jong ◽  
Wojciech Osikowicz ◽  
William R. Salaneck
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Organic Interfaces ◽  
Energy Level Alignment

Energy Level Alignment at Bebq2/PEI/ITO Interfaces Studied by UV Photoemission Spectroscopy

MRS Advances ◽  
2017 ◽  
Vol 2 (42) ◽  
pp. 2261-2266
Author(s):  
Kohei Shimizu ◽  
Hirohiko Fukagawa ◽  
Katsuyuki Morii ◽  
Hiroumi Kinjo ◽  
Tomoya Sato ◽  
...  
Keyword(s):  
Energy Level ◽  
Work Function ◽  
Indium Tin Oxide ◽  
Electron Injection ◽  
Photoemission Spectroscopy ◽  
Level Shift ◽  
Kelvin Probe ◽  
Vacuum Level ◽  
Energy Level Alignment ◽  
Improvement Effect

ABSTRACTA polyethyleneimine (PEI) interlayer has been applied on indium tin oxide (ITO) to improve electron injection in organic devices including inverted organic light-emitting diodes (OLEDs). To understand the improvement effect by PEI insertion, the energy level alignment at bis(10-hydroxybenzo[h]quinolinato)beryllium (Bebq2)/PEI/ITO interfaces was investigated by UV photoemission spectroscopy (UPS). The deposition of a PEI layer was found to reduce the absolute work function of ITO by 1.4 eV. The vacuum level shifts at Bebq2/ITO and Bebq2/PEI interfaces were also determined as 0.3 eV and 0.1 eV in the direction to reduce the electron injection barrier, respectively. Thus the work function reduction by PEI and downward vacuum level shift at the Bebq2/PEI interface can contribute to the improvement effect. Kelvin probe measurement revealed the weak orientation polarization in Bebq2 film with the bottom side positively polarized. This polarization polarity is also advantageous for electron injection in inverted devices.

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