Condensation-Induced Decrease of Small-Angle X-ray Scattering Intensity in Gelling Silica Solutions

2010 ◽  
Vol 114 (41) ◽  
pp. 17350-17357 ◽  
Author(s):  
Cedric J. Gommes ◽  
Jean-Paul Pirard ◽  
Bart Goderis
Keyword(s):  
Small Angle ◽  
Scattering Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Interpretation of small-angle x-ray scattering intensity distribution from fluctuating lamellae in a ternary system: sodium octyl sulfate-water-decanol

Langmuir ◽  
1991 ◽  
Vol 7 (9) ◽  
pp. 1895-1899
Author(s):  
Eric Y. Sheu ◽  
Sow Hsin. Chen ◽  
Bruce L. Carvalho ◽  
J. S. Lin ◽  
Malcolm. Capel
Keyword(s):  
Ternary System ◽  
Intensity Distribution ◽  
Small Angle ◽  
Scattering Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
System Sodium ◽  
Ray Scattering

scholarly journals Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's law

2021 ◽  
Vol 77 (1) ◽  
pp. 42-53
Author(s):  
Vladimir M. Kaganer ◽  
Oleg V. Konovalov ◽  
Sergio Fernández-Garrido
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
Root Mean Square Roughness ◽  
Scattering Intensity ◽  
X Ray ◽  
Gan Nanowires ◽  
X Ray Scattering ◽  
Orientational Distribution ◽  
Ray Scattering

Small-angle X-ray scattering from GaN nanowires grown on Si(111) is measured in the grazing-incidence geometry and modelled by means of a Monte Carlo simulation that takes into account the orientational distribution of the faceted nanowires and the roughness of their side facets. It is found that the scattering intensity at large wavevectors does not follow Porod's law I(q) ∝ q −4. The intensity depends on the orientation of the side facets with respect to the incident X-ray beam. It is maximum when the scattering vector is directed along a facet normal, reminiscent of surface truncation rod scattering. At large wavevectors q, the scattering intensity is reduced by surface roughness. A root-mean-square roughness of 0.9 nm, which is the height of just 3–4 atomic steps per micrometre-long facet, already gives rise to a strong intensity reduction.

Collimation problem in small-angle X-ray scattering for anisotropic objects: statement and solution

2014 ◽  
Vol 47 (5) ◽  
pp. 1552-1561
Author(s):  
Denis D. Zakharov ◽  
Alexander V. Smirnov ◽  
Boris A. Fedorov
Keyword(s):  
Small Angle ◽  
Two Dimensional ◽  
Scattering Intensity ◽  
X Ray ◽  
B Splines ◽  
X Ray Scattering ◽  
Collimation System ◽  
Friedman Method ◽  
Theoretical Scattering ◽  
Ray Scattering

The problem of removal of collimation distortion due to employing a slit collimation system in small-angle X-ray scattering experiments is considered for anisotropic objects in general and for orientated macromolecules in particular. A mathematical statement of the problem is presented, and two approaches to `de-smear' the experimental scattering intensity are described. The first method seeks the theoretical scattering intensity as a linear combination of two-dimensional basis functions (B splines). The combination coefficients are found using the χ2and two-dimensional curvature-minimization criteria. The second approach is based on the iterative Friedman method, which was generalized to be effective for the problem of interest. The described methods are applied to simulated and experimental data, and the results are discussed.

scholarly journals Small-angle X-ray scattering intensity of multiscale models of spheres

2019 ◽  
Vol 52 (6) ◽  
pp. 1348-1357
Author(s):  
Loïc Sorbier ◽  
Maxime Moreaud ◽  
Séverine Humbert
Keyword(s):  
Small Angle ◽  
Cox Model ◽  
Finite Size ◽  
Finite Size Effect ◽  
Multiscale Models ◽  
Boolean Models ◽  
Scattering Intensity ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

The different approaches found in the literature to compute small-angle X-ray scattering intensities of stochastic Boolean models from their analytical formulations or their numerical realizations are reviewed. The advantages and drawbacks of the methods for the interpretation of small-angle X-ray scattering curves are investigated. Examples of multiscale models built from union and intersection of Boolean models of spheres and from Gamma or lognormal radius distributions are given. The scattering intensity computed from projections of realizations of such models is compared with the intensity computed from their analytical covariance. It appears that computation from projection induces a strong finite-size effect with a relative constant variance equal to 0.5. Comparison of scattering intensities of an intersection of Boolean model and the corresponding Cox model shows only subtle differences.

A Revised O2 Reduction Model in Li-O2 Batteries as Revealed by in Situ Small Angle X-Ray Scattering

2019 ◽  
Author(s):  
Christian Prehal ◽  
Aleksej Samojlov ◽  
Manfred Nachtnebel ◽  
Manfred Kriechbaum ◽  
Heinz Amenitsch ◽  
...  
Keyword(s):  
Small Angle ◽  
Wide Angle ◽  
Reduction Mechanism ◽  
Reduction Model ◽  
X Ray ◽  
X Ray Scattering ◽  
O2 Reduction ◽  
Ray Scattering

<b>Here we use in situ small and wide angle X-ray scattering to elucidate unexpected mechanistic insights of the O2 reduction mechanism in Li-O2 batteries.<br></b>

In situ Time-Resolved Small-Angle X-ray Scattering Reveals the Formation Kinetics of Polyelectrolyte Complex Micelles

2019 ◽  
Author(s):  
Hao Wu ◽  
Jeffrey Ting ◽  
Siqi Meng ◽  
Matthew Tirrell
Keyword(s):  
Small Angle ◽  
Self Assembly ◽  
Electrostatic Interactions ◽  
Polyelectrolyte Complex ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Kinetics Of ◽  
Ray Scattering

We have directly observed the <i>in situ</i> self-assembly kinetics of polyelectrolyte complex (PEC) micelles by synchrotron time-resolved small-angle X-ray scattering, equipped with a stopped-flow device that provides millisecond temporal resolution. This work has elucidated one general kinetic pathway for the process of PEC micelle formation, which provides useful physical insights for increasing our fundamental understanding of complexation and self-assembly dynamics driven by electrostatic interactions that occur on ultrafast timescales.

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