Nanoelectronic Properties of a Model System and of a Conjugated Polymer: A Study by Kelvin Probe Force Microscopy and Scanning Conductive Torsion Mode Microscopy
2010 ◽
Vol 114
(15)
◽
pp. 7161-7168
◽
Keyword(s):
2017 ◽
Vol 5
(30)
◽
pp. 7446-7451
◽
Keyword(s):
2005 ◽
Vol 44
(7B)
◽
pp. 5370-5373
◽
2018 ◽
Keyword(s):
Keyword(s):
2010 ◽
Vol 114
(48)
◽
pp. 20672-20677
◽