Structural Determination of Bulk and Surface Tungsten Oxides with UV−vis Diffuse Reflectance Spectroscopy and Raman Spectroscopy

2007 ◽  
Vol 111 (41) ◽  
pp. 15089-15099 ◽  
Author(s):  
Elizabeth I. Ross-Medgaarden ◽  
Israel E. Wachs
Keyword(s):  
Raman Spectroscopy ◽  
Diffuse Reflectance ◽  
Diffuse Reflectance Spectroscopy ◽  
Reflectance Spectroscopy ◽  
Structural Determination ◽  
Tungsten Oxides

scholarly journals Absorption and Remission Characterization of Pure, Dielectric (Nano-)Powders Using Diffuse Reflectance Spectroscopy: An End-To-End Instruction

2019 ◽  
Vol 9 (22) ◽  
pp. 4933 ◽  
Author(s):  
Sergej Bock ◽  
Christian Kijatkin ◽  
Dirk Berben ◽  
Mirco Imlau
Keyword(s):  
Diffuse Reflectance ◽  
Diffuse Reflectance Spectroscopy ◽  
Mie Scattering ◽  
Reflectance Spectroscopy ◽  
Visible Spectral Range ◽  
Host Matrix ◽  
Material Sciences ◽  
End To End

This paper addresses the challenging task of optical characterization of pure, dielectric (nano-)powders with the aim to provide an end-to-end instruction from appropriate sample preparation up to the determination of material remission and absorption spectra. We succeeded in establishing an innovative preparation procedure to reproducibly obtain powder pellet samples with an ideal Lambertian scattering behavior. As a result, a procedure based on diffuse reflectance spectroscopy was developed that allows for (i) performing reproducible and artifact-free, high-quality measurements as well as (ii) a thorough optical analysis using Monte Carlo and Mie scattering simulations yielding the absorption spectrum in the visible spectral range. The procedure is valid for the particular case of powders that can be compressed into thick, non-translucent pellets and neither requires embedding of the dielectric (nano-)powders within an appropriate host matrix for measurements nor the use of integrating spheres. The reduced spectroscopic procedure minimizes the large number of sources for errors, enables an in-depth understanding of non-avoidable artifacts and is of particular advantage in the field of material sciences, i.e., for getting first insights to the optical features of a newly synthesized, pure dielectric powder, but also as an inline inspection tool for massively parallelised material characterization.

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