Chain Structures of Surface Hydroxyl Groups Formed via Line Oxygen Vacancies on TiO2(110) Surfaces Studied Using Noncontact Atomic Force Microscopy

2005 ◽  
Vol 109 (50) ◽  
pp. 23948-23954 ◽  
Author(s):  
Yoshimichi Namai ◽  
Osamu Matsuoka
Keyword(s):  
Atomic Force Microscopy ◽  
Oxygen Vacancies ◽  
Hydroxyl Groups ◽  
Surface Hydroxyl ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Hydroxyl Groups ◽  
Line Oxygen

Atomic Force Microscopy (AFM) as a Powerful Tool to Study Temperature-Dependent Polymer Film Formation

2017 ◽  
Vol 139 (2) ◽  
Author(s):  
Fei Long ◽  
Chang Kyoung Choi
Keyword(s):  
Atomic Force Microscopy ◽  
Polymer Film ◽  
Boiling Point ◽  
Water Layer ◽  
Angle Measurement ◽  
Hydroxyl Groups ◽  
Scanning Method ◽  
Surface Hydroxyl ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscopy (AFM) is one of the most effective tools in nanotechnology researches. Using the raster scanning method with a soft cantilever, three dimensional sample surface topography can be obtained with a sub-nanometer resolution. In this study, AFM is employed to characterize the nanostructures of polymer film under two temperature treatments. 3-aminopropyltriethoxysilane (APTES) is selected as a model polymer molecule due to its wide applications for amino-functionalization of Si/SiOx based surfaces, such as silicon and mica. The APTES molecule has three ethoxy groups that can react with surface hydroxyl groups or with another APTES molecule through a siloxane bond. The self-assembled APTES self-assembly film has typically three configurations, namely uncrosslinked monolayer, crosslinked monolayer, and multilayer. Ten percent aqueous solution is used to cover the entire mica surfaces. Then the surfaces are rinsed with DI water and dried with N2 to remove left over solution. Two hours incubation was followed in 80°C or 140°C, respectively. At 80 °C (below the boiling point), the uniform APTES film is obtained. On the other hand, at 140 °C (above the boiling point), the film exhibits multilayer structure, as confirmed by AFM images. Contact angle measurement shows that the multilayer film is less wettable than the monolayer film by 20°. It seems that the evaporation rate of the water layer on the substrate is the key to various film configurations.

Non-contact atomic force microscopy study of hydroxyl groups on the spinel MgAl2O4(100) surface

2012 ◽  
Vol 23 (32) ◽  
pp. 325703 ◽  
Author(s):  
F Federici Canova ◽  
A S Foster ◽  
M K Rasmussen ◽  
K Meinander ◽  
F Besenbacher ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Microscopy Study ◽  
Hydroxyl Groups ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force ◽  
Spinel Mgal2o4

scholarly journals Evaluation of the Mechanical Properties of ZnO Nanorods Treated with Oxygen Plasma using Atomic Force Microscopy

2021 ◽  
Vol 59 (3) ◽  
pp. 209-216
Author(s):  
Donghyuck Park ◽  
Yijun Yang ◽  
Kwanlae Kim
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Plasma Treatment ◽  
Elastic Properties ◽  
Oxygen Vacancies ◽  
Oxygen Plasma ◽  
Zno Nanorods ◽  
Oxygen Plasma Treatment ◽  
Force Microscopy ◽  
Atomic Force

Zinc oxide (ZnO) simultaneously exhibits semiconducting and piezoelectric properties. ZnO in the form of nanorods has been studied intensively for application in self-powering devices. The power generation in piezoelectric nanogenerators based on ZnO nanorods can be improved via several approaches, including an oxygen plasma treatment. When ZnO nanorods are exposed to oxygen plasma, the charge carrier concentration decreases and the piezoelectric output voltage consequently increases. However, the effects of oxygen plasma on the mechanical properties of ZnO nanorods has not been systematically studied using a precise measurement technique. Given the size of ZnO nanorods, atomic force microscopy (AFM) is a suitable method for manipulating individual ZnO nanorods and measuring their elastic properties. In the present work, we observed the effects of oxygen plasma on the elemental composition and microstructure of ZnO nanorods. First of all, the surface roughness of the ZnO nanorods was analyzed using AFM, revealing that it increased due to the etching effect of the oxygen plasma. From X-ray photoelectron spectroscopy (XPS) measurements, three distinct peaks corresponding to lattice oxygen, oxygen vacancies, and absorbed oxygen on the surface were identified. The XPS analysis results showed that oxygen vacancy defects on the ZnO nanorods were decreased by oxygen plasma treatment. Next, the effects of oxygen plasma on the elastic properties of ZnO nanorods were studied using lateral force microscopy. It was confirmed that the elastic modulus of ZnO nanorods increased due to the reduced number of defects originating from oxygen vacancies.

Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales

2011 ◽  
Vol 1318 ◽  
Author(s):  
Peter Schön ◽  
Kristóf Bagdi ◽  
Kinga Molnár ◽  
Patrick Markus ◽  
Saurabh Dutta ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tensile Testing ◽  
Elastic Moduli ◽  
Hydroxyl Groups ◽  
Stoichiometric Ratio ◽  
Length Scales ◽  
Rubber Blends ◽  
Force Microscopy ◽  
Rubber Blend ◽  
Atomic Force

ABSTRACTIn the work presented here atomic force microscopy (AFM) based mechanical mapping techniques - HarmoniX imaging and Peak Force Tapping - were applied to determine the surface elastic modulus of phase separated polyurethanes and silica reinforced rubbers across the length scales. Segmented polyether polyurethanes (PUs) were prepared with varying stoichiometric ratio of the isocyanate and hydroxyl groups. The effect of molar mass, as well as the type and number of end-groups on their morphology was investigated. Smooth PU samples for AFM imaging were prepared by ultramicrotonomy. The micro phase separated morphology of the phase separated PUs showed characteristic “fingerprint” AFM phase images. Surface modulus values obtained by AFM were compared to bulk modulus values obtained by tensile testing. The moduli were mapped quantitatively with nanoscale resolution and were in excellent agreement for both AFM modes. Surface mean moduli values do not coincide with bulk values obtained via tensile testing which is attributed to fundamentally different averaging procedures and effects that lead to the respective modulus values obtained via surface and volume averaging. EPDM and SBR rubbers and rubber blends thereof were prepared with varying concentrations of silica nanoparticles and studied in order to investigate the effect of different composition on the resulting morphology (filler distribution) and elastic moduli on a specific rubber or rubber blend sample. Elastic moduli of the rubber and rubber blend samples were first measured by bulk tensile testing. The morphology of the rubber samples was visualized by height and phase imaging. Surface elastic moduli of silica reinforced rubbers and rubber blends were mapped quantitatively and compared with bulk tensile test results. AFM allowed the determination of modulus distributions at the sections imaged. As potential reasons for the observed differences between bulk and surface modulus different averaging procedures like surface and bulk averaging of AFM vs. tensile testing, different filler distributions in SBR and EPDM and the AFM modulus calibration procedures can be named.

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