Three-Dimensional Etching Profiles and Surface Speciations (via Attenuated Total Reflection-Fourier Transform Infrared Spectroscopy) of Silicon Nanowires in NH4F-Buffered HF Solutions: A Double Passivation Model
2005 ◽
Vol 109
(46)
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pp. 21716-21724
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2020 ◽
1990 ◽
Vol 193
(2)
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pp. 409-420
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2019 ◽
Vol 53
(1)
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pp. 27-39
2020 ◽
Vol 53
(16)
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pp. 2656-2670
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2020 ◽
Vol 241
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pp. 118665
2019 ◽
Vol 5
(2)
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pp. 119-125
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