scholarly journals Formation of Metallic Nanocrystals from Gel-like Precursor Films for CVD Nanotube Growth:  An in Situ TEM Characterization

2004 ◽  
Vol 108 (31) ◽  
pp. 11357-11360 ◽  
Author(s):  
Christian Klinke ◽  
Jean-Marc Bonard ◽  
Klaus Kern
Keyword(s):  
In Situ Tem ◽  
Tem Characterization ◽  
Nanotube Growth

Development of an In-Situ Nanoindentation Specimen Holder for the High Voltage Electron Microscope

1997 ◽  
Vol 3 (S2) ◽  
pp. 593-594 ◽  
Author(s):  
M.A. Wall ◽  
U. Dahmen
Keyword(s):  
In Situ Tem ◽  
Post Mortem ◽  
Delamination Wear ◽  
Voltage Electron ◽  
Specimen Holder ◽  
Tem Characterization ◽  
Natural Sampling ◽  
Sampling Volume ◽  
Considerable Work

Progress on the development of an in-situ nanoindentation specimen holder for the Kratos 1.5MeV HVEM located at the National Center for Electron Microscopy, Berkeley, CA, USA, is reported. There is currently considerable work being reported on the mechanical properties (i.e., hardness, delamination, wear, etc.) of single and multicomponent thin films, nanoclusters and fibers by techniques such as nanoindenting, ref. [1] are recent examples. However, with all of these tests there has not been direct, unambiguous observation of the response or evolution of the microstructure. With many of these reports, there has been little “post-mortem” TEM characterization and there has been no real attempts to simulate these dynamically in the TEM. For the case of nano-testing of the materials the interaction volumes are often on the scale of the natural sampling volume of the HVEM. It seems natural that post-mortem and in-situ TEM characterization techniques be applied.

scholarly journals In Situ TEM Characterization of Electrochemical Systems

2011 ◽  
Vol 17 (S2) ◽  
pp. 1572-1573 ◽  
Author(s):  
K Noh ◽  
L Sun ◽  
X Chen ◽  
J Wen ◽  
S Dillon
Keyword(s):  
In Situ Tem ◽  
Electrochemical Systems ◽  
Tem Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

In situ TEM characterization of interfacial reaction in Sn–3.5Ag/electroless Ni(P) solder joint

2011 ◽  
Vol 64 (7) ◽  
pp. 597-600 ◽  
Author(s):  
Han-Byul Kang ◽  
Jee-Hwan Bae ◽  
Jeong-Won Yoon ◽  
Seung-Boo Jung ◽  
Jongwoo Park ◽  
...  
Keyword(s):  
Solder Joint ◽  
Interfacial Reaction ◽  
In Situ Tem ◽  
Tem Characterization ◽  
Electroless Ni

scholarly journals A Novel Technique for In-Situ TEM Characterization of Precipitates in Alloys

2018 ◽  
Vol 24 (S1) ◽  
pp. 12-13
Author(s):  
Jiancun Rao ◽  
Xiaodong Zhang ◽  
Vasek Ocelik ◽  
David Vainchtein ◽  
Jeff T.M. De Hosson ◽  
...  
Keyword(s):  
In Situ Tem ◽  
Novel Technique ◽  
Tem Characterization

scholarly journals Double shadow masking sample preparation method for in‐situ TEM characterization

Nano Select ◽  
2020 ◽  
Vol 1 (4) ◽  
pp. 413-418
Author(s):  
Carmel Mary Esther Alphonse ◽  
Mohan Muralikrishna Garlapati ◽  
Sven Hilke ◽  
Gerhard Wilde
Keyword(s):  
Sample Preparation ◽  
Preparation Method ◽  
In Situ Tem ◽  
Sample Preparation Method ◽  
Tem Characterization

Improved Na-storage cycling of amorphous-carbon-sheathed Ni 3 S 2 arrays and investigation by in situ TEM characterization

2017 ◽  
Vol 5 ◽  
pp. 99-106 ◽  
Author(s):  
Xueke Xia ◽  
Qiannan Wang ◽  
Qi Zhu ◽  
Jian Xie ◽  
Jiangwei Wang ◽  
...  
Keyword(s):  
Amorphous Carbon ◽  
In Situ Tem ◽  
Tem Characterization
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