Microdrops on Atomic Force Microscope Cantilevers:  Evaporation of Water and Spring Constant Calibration

2005 ◽  
Vol 109 (1) ◽  
pp. 253-263 ◽  
Author(s):  
Elmar Bonaccurso ◽  
Hans-Jürgen Butt
Keyword(s):  
Atomic Force Microscope ◽  
Spring Constant ◽  
Atomic Force

Method to determine the spring constant of atomic force microscope cantilevers

2004 ◽  
Vol 75 (2) ◽  
pp. 565-567 ◽  
Author(s):  
Christopher T. Gibson ◽  
Daniel J. Johnson ◽  
Christopher Anderson ◽  
Chris Abell ◽  
Trevor Rayment
Keyword(s):  
Atomic Force Microscope ◽  
Spring Constant ◽  
Atomic Force

scholarly journals Characterisation of the Material and Mechanical Properties of Atomic Force Microscope Cantilevers with a Plan-View Trapezoidal Geometry

2019 ◽  
Vol 9 (13) ◽  
pp. 2604 ◽  
Author(s):  
Ashley D. Slattery ◽  
Adam J. Blanch ◽  
Cameron J. Shearer ◽  
Andrew J. Stapleton ◽  
Renee V. Goreham ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Young’S Modulus ◽  
Correction Factor ◽  
Young's Modulus ◽  
Spring Constant ◽  
Beam Equation ◽  
Euler Beam ◽  
Plan View ◽  
Atomic Force

Cantilever devices have found applications in numerous scientific fields and instruments, including the atomic force microscope (AFM), and as sensors to detect a wide range of chemical and biological species. The mechanical properties, in particular, the spring constant of these devices is crucial when quantifying adhesive forces, material properties of surfaces, and in determining deposited mass for sensing applications. A key component in the spring constant of a cantilever is the plan-view shape. In recent years, the trapezoidal plan-view shape has become available since it offers certain advantages to fast-scanning AFM and can improve sensor performance in fluid environments. Euler beam equations relating cantilever stiffness to the cantilever dimensions and Young’s modulus have been proven useful and are used extensively to model cantilever mechanical behaviour and calibrate the spring constant. In this work, we derive a simple correction factor to the Euler beam equation for a beam-shaped cantilever that is applicable to any cantilever with a trapezoidal plan-view shape. This correction factor is based upon previous analytical work and simplifies the application of the previous researchers formula. A correction factor to the spring constant of an AFM cantilever is also required to calculate the torque produced by the tip when it contacts the sample surface, which is also dependent on the plan-view shape. In this work, we also derive a simple expression for the torque for triangular plan-view shaped cantilevers and show that for the current generation of trapezoidal plan-view shaped AFM cantilevers, this will be a good approximation. We shall apply both these correction factors to determine Young’s modulus for a range of trapezoidal-shaped AFM cantilevers, which are specially designed for fast-scanning. These types of AFM probes are much smaller in size when compared to standard AFM probes. In the process of analysing the mechanical properties of these cantilevers, important insights are also gained into their spring constant calibration and dimensional factors that contribute to the variability in their spring constant.

Tilt of Atomic Force Microscope Cantilevers:  Effect on Spring Constant and Adhesion Measurements

Langmuir ◽  
2004 ◽  
Vol 20 (7) ◽  
pp. 2760-2764 ◽  
Author(s):  
Lars-Oliver Heim ◽  
Michael Kappl ◽  
Hans-Jürgen Butt
Keyword(s):  
Atomic Force Microscope ◽  
Spring Constant ◽  
Atomic Force

scholarly journals An analytic model for accurate spring constant calibration of rectangular atomic force microscope cantilevers

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Rui Li ◽  
Hongfei Ye ◽  
Weisheng Zhang ◽  
Guojun Ma ◽  
Yewang Su
Keyword(s):  
Atomic Force Microscope ◽  
Spring Constant ◽  
Analytic Model ◽  
Atomic Force

Calibration of the effective spring constant of ultra-short cantilevers for a high-speed atomic force microscope

2015 ◽  
Vol 26 (6) ◽  
pp. 065001 ◽  
Author(s):  
Yun-Peng Song ◽  
Sen Wu ◽  
Lin-Yan Xu ◽  
Jun-Ming Zhang ◽  
Dante J Dorantes-Gonzalez ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Speed ◽  
Spring Constant ◽  
Atomic Force ◽  
Effective Spring Constant
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