Refractive Index Measurements of Films with Biaxial Symmetry. 2. Determination of Film Thickness and Refractive Indices Using Polarized Transmission Spectra in the Transparent Wavelength Range

2005 ◽  
Vol 109 (26) ◽  
pp. 12819-12825 ◽  
Author(s):  
Jie Diao ◽  
Dennis W. Hess
Keyword(s):  
Refractive Index ◽  
Film Thickness ◽  
Wavelength Range ◽  
Refractive Indices ◽  
Transmission Spectra

scholarly journals Refractive index evaluation of porous silicon using Bragg reflectors

2018 ◽  
Vol 64 (1) ◽  
pp. 72 ◽  
Author(s):  
D. Estrada-Wiese ◽  
J.A. Del Río
Keyword(s):  
Refractive Index ◽  
Porous Silicon ◽  
Simple Procedure ◽  
Merit Function ◽  
Refractive Indices ◽  
Bragg Reflectors ◽  
Photonic Bandgaps ◽  
Photonic Structures ◽  
Index Evaluation

There are two main physical properties needed to fabricate 1D photonic structures and form perfect photonic bandgaps: the quality of thethickness periodicity and the refractive index of their components. Porous silicon (PS) is a nano-structured material widely used to prepare 1Dphotonic crystals due to the ease of tuning its porosity and its refractive index by changing the fabrication conditions. Since the morphologyof PS changes with porosity, the determination of PS’s refractive index is no easy task. To find the optical properties of PS we can usedifferent effective medium approximations (EMA). In this work we propose a method to evaluate the performance of the refractive index ofPS layers to build photonic Bragg reflectors. Through a quality factor we measure the agreement between theory and experiment and thereinpropose a simple procedure to determine the usability of the refractive indices. We test the obtained refractive indices in more complicatedstructures, such as a broadband Vis-NIR mirror, and by means of a Merit function we find a good agreement between theory and experiment.With this study we have proposed quantitative parameters to evaluate the refractive index for PS Bragg reflectors. This procedure could havean impact on the design and fabrication of 1D photonic structures for different applications.

Refractive index measurements and order parameter determination of the liquid crystal p-ethoxybenzilidene-p-n-butylaniline

1981 ◽  
Vol 59 (4) ◽  
pp. 515-520 ◽  
Author(s):  
P. Palffy-Muhoray ◽  
D. A. Balzarini
Keyword(s):  
Refractive Index ◽  
Liquid Crystal ◽  
Order Parameter ◽  
Orientational Order ◽  
Parameter Determination ◽  
Refractive Indices ◽  
Temperature Changes ◽  
Interferometric Technique ◽  
Anisotropic Fluids

Using a simple new interferometric technique, the ordinary and extraordinary refractive indices of the nematic liquid crystal p-ethoxybenzilidene-p-n-butylaniline have been measured separately as a function of temperature. Changes in the refractive indices have been measured with an accuracy of ±0.005% and the absolute values with an accuracy of ±0.5%. Thermal expansivity data has been obtained by utilizing a specially constructed thermometer containing the sample. By using a recently developed Clausius–Mossotti relation for anisotropic fluids, the effective molecular polarizability and hence the orientational order parameter have been obtained from refractive index and density measurements as a function of temperature.

The use of a slit in determining refractive indices with the microscope

1917 ◽  
Vol 18 (84) ◽  
pp. 130-132
Author(s):  
John William Evans
Keyword(s):  
Crystal Structure ◽  
Refractive Index ◽  
Optical Properties ◽  
Critical Angle ◽  
Total Reflection ◽  
Index Of Refraction ◽  
Refractive Indices ◽  
Object Image ◽  
Ordinary Object

Certain optical properties of crystals, and more particularly the refractive index, may be determined either in the directions-image, often referred to as the 'image in convergent light', or in the ordinary object-image in which the object itself is seen. In the former case, in which the index of refraction is 'usually determined by means of the critical angle of total-reflection, every point in the image corresponds to a single direction of propagation of the wave-front through the crystal-structure and to the two corresponding directions of vibration. One of these can, however, be eliminated by the insertion of a nicol in an approximate position, and thus all ambiguity in the determination of the refractive index is removed.

Theoretical Investigation of a Long Period Grating Sensor Employing Multilayer Fiber Geometry

2020 ◽  
Vol 18 (10) ◽  
pp. 763-769
Author(s):  
Pragya Mishra ◽  
Sachin Singh ◽  
Pooja Lohia ◽  
D. K. Dwivedi
Keyword(s):  
Refractive Index ◽  
Analytical Method ◽  
Solution Method ◽  
Refractive Indices ◽  
Graphical Solution ◽  
Long Period Grating ◽  
Theoretical Formulation ◽  
Long Period ◽  
Layer Fiber

A theoretical formulation of the long-period grating sensor is implemented with respect to efficient refractive indices of core and cladding. The obtained result is utilized further for determination of ERIs of core and cladding using graphical analytical method and multilayer fiber geometry. ERI values of primary guided core, bi and tri layer fiber geometry using MATLAB software. In the present paper effective refractive index of core and cladding for the two and three layers have been investigated. The cladding modes have also been calculated using Erdogan’s proposed three-layer geometry as well as two-layer graphical solution method. We have compared both the techniques, discussed the limitations of graphical solution method and the benefits of three-layer geometry.

ON THE DETERMINATION OF REFRACTIVE INDEX AND THICKNESS OF THIN DIELECTRIC FILMS FROM MEASUREMENT OF TRANSMITTANCE

2012 ◽  
Vol 19 (06) ◽  
pp. 1250059
Author(s):  
Z. H. SHAH ◽  
I. AHMAD ◽  
Q. A. TAHIR ◽  
E. E. KHAWAJA
Keyword(s):  
Refractive Index ◽  
Normal Incidence ◽  
Dielectric Films ◽  
Refractive Indices ◽  
Transparent Film ◽  
Transparent Substrate ◽  
Thin Dielectric Films

Refractive index and thickness of a transparent film (ZnS) on a transparent substrate (BK-7 glass) have been determined from measurement of normal incidence transmittance, using different methods. Some of the methods considered here are most widely used, as is apparent from the literature. The outcome of this study could help a researcher in selecting an appropriate method for such an application. The values of the refractive indices determined by different methods were found to be close to each other (within 0.5%). However, large (up to 4.4%) differences existed in the values of the thickness determined by different methods.

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