In Situ Spectroscopic and Microscopic Study on Dispersion of Ag Nanoparticles in Polymer Thin Films

2000 ◽  
Vol 104 (44) ◽  
pp. 10168-10173 ◽  
Author(s):  
Kensuke Akamatsu ◽  
Nobuo Tsuboi ◽  
Yoshinori Hatakenaka ◽  
Shigehito Deki
2016 ◽  
Vol 87 (1) ◽  
pp. 015106 ◽  
Author(s):  
Dat Tien Hoang ◽  
Jaesung Yang ◽  
Keewook Paeng ◽  
Youngah Kwon ◽  
Oh Sang Kweon ◽  
...  

2009 ◽  
Vol 38 (9) ◽  
pp. 2646 ◽  
Author(s):  
G. V. Ramesh ◽  
S. Porel ◽  
T. P. Radhakrishnan

2020 ◽  
Vol 12 (32) ◽  
pp. 36417-36427
Author(s):  
Yeon-Ju Kim ◽  
Sehyun Lee ◽  
Muhammad. R. Niazi ◽  
Kyoungtae Hwang ◽  
Ming-Chun Tang ◽  
...  

2005 ◽  
Vol 890 ◽  
Author(s):  
Chunhua Li ◽  
Jun Jiang ◽  
Miriam J. Rafailovich ◽  
Jonathan C. Sokolov

ABSTRACTPreviously, we reported that the viscosity of a polymer film can be measured in situ by observing the liquid-liquid dewetting of polymer bilayer films. In this study, we use the technique to investigate the effect of film thickness and surface interactions on the effective viscosity of polymer thin films. We found that the effective viscosity increases dramatically with decreasing the film thickness. We attribute this to the pinning of the polymer chains at the strongly interacting polymer/Silicon interface.


2009 ◽  
Vol 33 (8) ◽  
pp. 1720 ◽  
Author(s):  
Rafael Abargues ◽  
Kamal Abderrafi ◽  
E. Pedrueza ◽  
Rachid Gradess ◽  
J. Marqués-Hueso ◽  
...  

2017 ◽  
Vol 5 (14) ◽  
pp. 3553-3560 ◽  
Author(s):  
E. Nadal ◽  
N. Barros ◽  
H. Glénat ◽  
J. Laverdant ◽  
D. S. Schmool ◽  
...  

This is a novel method for fabricating plasmonic nanoparticle gratings with original optical properties induced by laser photo-reduction of gold precursors in PVA thin films.


2014 ◽  
Vol 70 (a1) ◽  
pp. C880-C880
Author(s):  
Naoya Torikai

Neutron reflectometry is indispensable for the studies on material interfaces and thin films, since it can probe the interfaces non-destructively with a quite high depth resolution. Here, the interfacial structures of polymer thin films in different environments: hot and wet, were examined by means of in-situ neutron reflectometry. The neutron reflectivity measurements were performed on a time-of-flight reflectometer SOFIA [1, 2] at the Japan Proton Accelerator Research Complex (J-PARC). The depth distribution of components was investigated for binary blend thin films of polystyrenes with different molecular weights to clarify the mechanism of de-wetting suppression effect by blending a small amount of the longer homologue. It was found by static measurements that the longer chains deplete from the air surface of the film, while they slightly localize at the interface with the substrate. The time evolution of the component distribution was also examined by in-situ measurements above the glass transition temperature in a vacuum. The structural change of lamellarly-ordered styrene-2-vinylpyridine (PS-P2VP) diblock copolymer thin film in contact with solvent was explored by in-situ neutron reflectometry with a conventional solid/liquid cell. During the block copolymer thin film was in contact with methanol, which is selective for P2VP, some of methanol penetrated into the film causing the structural change. However, the original structure was almost recovered after drying, though annealing effect was slightly observed. When toluene was made contact, which is selective for PS, the block copolymer thin film was immediately dissolved into, and never recovered.


2015 ◽  
Vol 27 (6) ◽  
pp. 2127-2136 ◽  
Author(s):  
Edward A. Lewis ◽  
Paul D. McNaughter ◽  
Zhongjie Yin ◽  
Yiqiang Chen ◽  
Jack R. Brent ◽  
...  

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