Rapid Surface Plasmon Resonance Immunoassay for the Determination of Deoxynivalenol in Wheat, Wheat Products, and Maize-Based Baby Food

2010 ◽  
Vol 58 (16) ◽  
pp. 8936-8941 ◽  
Author(s):  
Julie Meneely ◽  
Terence Fodey ◽  
Laura Armstrong ◽  
Michael Sulyok ◽  
Rudolf Krska ◽  
...  
Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.


2012 ◽  
Vol 5 (2) ◽  
pp. 117-126 ◽  
Author(s):  
J.P. Meneely ◽  
J.G. Quinn ◽  
E.M. Flood ◽  
J. Hajšlová ◽  
C.T. Elliott

This manuscript describes a rapid surface plasmon resonance (SPR) immunoassay for the simultaneous determination of the sum of T-2/HT-2 toxins (T-2/HT-2) and deoxynivalenol (DON), in cereals and cereal-based products. The assay is based on an inhibition format employing a monoclonal antibody raised against HT-2 with cross reactivity to T-2 and a polyclonal antibody raised against DON, thereby enabling the detection of the three trichothecene mycotoxins (types A and B). The surface chemistry involved an equal mixture of HT-2 and DON covalently coupled onto a high capacity COOH5 sensor chip. Using the specified antibodies and a mixed toxin sensor surface, and running calibration curves (HT-2 and DON) and samples in parallel it has been proven that it is feasible to develop a multiplex assay on this SPR platform. In-house validation has shown limits of detection of 12, 1 and 29 μg/kg for DON and 31, 47 and 36 μg/kg for HT-2 in wheat, breakfast cereal and maize-based baby food, respectively. Both intra-assay and inter-assay precision were calculated using fortified DON and HT-2 samples. Durum wheat, wheatbased breakfast cereal and maize-based baby food were spiked at various concentration levels and the coefficients of variation calculated ranged from 1.1% to 9.9% for DON and from 1.4% to 11.3% for HT-2. A high correlation was observed between the screening assay and confirmatory mass spectrometry.


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