Pressure-Induced Transport of DNA Confined in Narrow Capillary Channels

2012 ◽  
Vol 134 (17) ◽  
pp. 7400-7405 ◽  
Author(s):  
Xiayan Wang ◽  
Lei Liu ◽  
Qiaosheng Pu ◽  
Zaifang Zhu ◽  
Guangsheng Guo ◽  
...  
Keyword(s):  
2021 ◽  
Vol 2021 ◽  
pp. 1-10
Author(s):  
Mikhail Veysman

It is shown that the dynamics of electrons accelerated in narrow capillary waveguides is significantly influenced by the parametric excitation of their betatron oscillations. On the one hand, this excitation can irreversibly spoil the emittance of an accelerated electron bunch that limits the possibilities of their practical use. On the other hand, controlled parametric excitation of betatron oscillations can be used to generate short-pulse sources of synchrotron radiation. The article analyzes the regions of parametric instabilities, their dependence on the parameters of accelerated electron bunches and guiding structures, and their influence on the dynamics of accelerated electrons. The parameters of the generated synchrotron radiation are also estimated. Measurements of the spectral parameters of synchrotron radiation can serve as a tool for diagnostics of betatron oscillations and their excitation in the case of parametric resonances.


1931 ◽  
Vol 96 (3) ◽  
pp. 562-568 ◽  
Author(s):  
Robin Fåhræus ◽  
Torsten Lindqvist

Author(s):  
Juan P. Escandón ◽  
David A. Torres

Abstract This paper presents the analytical solution of a combined electroosmotic and pressure driven flow of multilayer immiscible fluids in a narrow capillary. The mathematical model is based in the Poisson-Boltzmann equation and the modified Navier-Stokes equations. In the steady-state analysis, we consider different conditions at the interfaces between the fluids as potential differences, surface charge densities and electro-viscous stresses balances, which are discussed in detail. Results show the transport phenomena coupled in the description of velocity distribution, by the analyzing of the dimensionless parameters obtained, such as: potential differences, surface charge densities, electrokinetic parameters, term involving the external pressure gradient, ratios of viscosity and of dielectric permittivity. Here, the presence of a net electric charges balance at the interfaces breaks the continuity of the electric potential distributions and viscous shear stresses, modifying the flow field; thus, the electrical conditions established at the interfaces play an important role on the flow behavior. The present work, in which the velocity field is described, aims to be an important contribution in the development of theoretical models that provide a better understanding about labs-on-a-chip design.


During the investigation of the secondary spectrum lines of hydrogen, in which Prof. Richardson and the present author have been recently engaged, we found many weak lines which are not recorded in any published tables. Most of them were found on the two spectrum plates taken by Prof. Merton and lent to us, as well as on our plates taken under quite different conditions from the above. Because our investigation was partly to find the regularity of the spectrum, it was thought highly desirable to know the accurate wave-lengths of these weak lines. On the above-mentioned plates of Prof. Merton, which were taken with an Anderson concave grating, the spectral lines were much better resolved than on our plates. They were also rather over-exposed, and therefore quite suitable to the present purpose. For these reasons the following measurements were entirely made with those plates. It should be added that these two plates were taken by Prof. Merton with a vacuum tube having a narrow capillary, and the current density must have been at least twenty-five times as great as in the tubes which Merton and Barratt used for measuring the lines given in their tables. There is little doubt that this and perhaps other differences in the conditions of excitation is the reason why the additional lines which I have measured were not observed by Merton and Barratt on the plates they used for measurement.


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