scholarly journals Synthesis and Characterization of Manganese-Doped Silicon Nanoparticles:  Bifunctional Paramagnetic-Optical Nanomaterial

2007 ◽  
Vol 129 (35) ◽  
pp. 10668-10669 ◽  
Author(s):  
Xiaoming Zhang ◽  
Marcin Brynda ◽  
R. David Britt ◽  
Elizabeth C. Carroll ◽  
Delmar S. Larsen ◽  
...  
Keyword(s):  
Silicon Nanoparticles ◽  
Synthesis And Characterization ◽  
Doped Silicon

(Invited) Fabrication and Characterization of B- or P- Doped Silicon Nanoparticles Embedded in SiOxNy Transparent Matrix

2020 ◽  
Vol MA2020-01 (16) ◽  
pp. 1059-1059
Author(s):  
Gérald Ferblantier ◽  
Fabien Ehrhardt ◽  
Yann Le Gall ◽  
Dominique Muller ◽  
Daniel Mathiot
Keyword(s):  
Silicon Nanoparticles ◽  
Doped Silicon ◽  
Fabrication And Characterization

ChemInform Abstract: Synthesis and Characterization of Discrete Luminescent Erbium-Doped Silicon Nanocrystals.

ChemInform ◽  
2010 ◽  
Vol 30 (22) ◽  
pp. no-no
Author(s):  
John St. John ◽  
Jeffery L. Coffer ◽  
Yandong Chen ◽  
Russell F. Pinizzotto
Keyword(s):  
Silicon Nanocrystals ◽  
Synthesis And Characterization ◽  
Erbium Doped ◽  
Doped Silicon

Synthesis and Characterization of Discrete Luminescent Erbium-Doped Silicon Nanocrystals

1999 ◽  
Vol 121 (9) ◽  
pp. 1888-1892 ◽  
Author(s):  
John St. John ◽  
Jeffery L. Coffer ◽  
Yandong Chen ◽  
Russell F. Pinizzotto
Keyword(s):  
Silicon Nanocrystals ◽  
Synthesis And Characterization ◽  
Erbium Doped ◽  
Doped Silicon

Synthesis and Characterization of Poly(vinylpyrrolidone)-Capped Silicon-Nanoparticles

2014 ◽  
Vol 14 (8) ◽  
pp. 5983-5987 ◽  
Author(s):  
Hayoung Kwon ◽  
Eunhee Lim ◽  
Sungkoo Lee ◽  
Kyeong K. Lee
Keyword(s):  
Silicon Nanoparticles ◽  
Synthesis And Characterization

High-resolution transmission electron microscopic study of highly oxygen doped silicon layer

1989 ◽  
Vol 47 ◽  
pp. 692-693
Author(s):  
H. Takaoka ◽  
M. Tomita ◽  
T. Hayashi
Keyword(s):  
High Resolution ◽  
Oxygen Concentration ◽  
Silicon Layer ◽  
Detailed Structure ◽  
Electron Microscopic ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Doped Silicon ◽  
Argon Ion

High resolution transmission electron microscopy (HRTEM) is the effective technique for characterization of detailed structure of semiconductor materials. Oxygen is one of the important impurities in semiconductors. Detailed structure of highly oxygen doped silicon has not clearly investigated yet. This report describes detailed structure of highly oxygen doped silicon observed by HRTEM. Both samples prepared by Molecular beam epitaxy (MBE) and ion implantation were observed to investigate effects of oxygen concentration and doping methods to the crystal structure.The observed oxygen doped samples were prepared by MBE method in oxygen environment on (111) substrates. Oxygen concentration was about 1021 atoms/cm3. Another sample was silicon of (100) orientation implanted with oxygen ions at an energy of 180 keV. Oxygen concentration of this sample was about 1020 atoms/cm3 Cross-sectional specimens of (011) orientation were prepared by argon ion thinning and were observed by TEM at an accelerating voltage of 400 kV.

Synthesis and Characterization of the Three Dicyclopentapyrenes

1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula
Keyword(s):  
Synthesis And Characterization
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