Photogenerated Hole Mobility in DNA Measured by Time-Resolved Microwave Conductivity

2006 ◽  
Vol 128 (7) ◽  
pp. 2212-2213 ◽  
Author(s):  
Ryuhei Yamagami ◽  
Kazuo Kobayashi ◽  
Akinori Saeki ◽  
Shu Seki ◽  
Seiichi Tagawa
2003 ◽  
Vol 763 ◽  
Author(s):  
A. Meeder ◽  
D. Fuertes Marrón ◽  
M. Ch. Lux-Steiner ◽  
M. Kunst

AbstractApplying the (contactless) time-resolved microwave conductivity technique (TRMC) to CVD- and PVD-grown device grade CuGaSe2 thin films experimental data of hole mobility and lifetime are obtained. TRMC data of stoichiometric and Gallium-rich, front and back side illuminated thin films are presented. In the Gallium-rich samples an extended decay over several orders of magnitude is observed. In the stoichiometric samples the majority of excess carriers decays nearly instantaneously. Differences in charge carrier transport at the front and the back side are discussed in the framework of a two layer defect model, previously reported in such absorber layers.


1993 ◽  
Vol 65 (8) ◽  
pp. 1723-1728 ◽  
Author(s):  
J. M. Warman ◽  
S. A. Jonker ◽  
W. Schuddeboom ◽  
M. P. de Haas ◽  
M. N. Paddon-Row ◽  
...  

2006 ◽  
Vol 910 ◽  
Author(s):  
Steve Reynolds

AbstractThe use of transient photoconductivity techniques in the investigation of carrier transport in microcrystalline silicon is described. Results are presented which highlight variations in transport parameters such as carrier mobility and density of states with structure composition. Hole mobility is significantly enhanced by crystalline content in the film of 10% or less. The density of states inferred from transport measurements parallel to and at right angles to the direction of film growth differ somewhat, suggesting that transport may be anisotropic.


1994 ◽  
Vol 90 (21) ◽  
pp. 3315-3322 ◽  
Author(s):  
Scot T. Martin ◽  
Hartmut Herrmann ◽  
Wonyong Choi ◽  
Michael R. Hoffmann

1997 ◽  
Vol 86 (1-3) ◽  
pp. 2355-2356 ◽  
Author(s):  
R.J.O.M. Hoffman ◽  
G.P. van der Laan ◽  
M.P. de Haas ◽  
K. Tanigaki

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