scholarly journals Structural Characterization of a Pentacene Monolayer on an Amorphous SiO2Substrate with Grazing Incidence X-ray Diffraction

2004 ◽  
Vol 126 (13) ◽  
pp. 4084-4085 ◽  
Author(s):  
Sandra E. Fritz ◽  
Stephen M. Martin ◽  
C. Daniel Frisbie ◽  
Michael D. Ward ◽  
Michael F. Toney
Keyword(s):  
Structural Characterization ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Structural Characterization of Epitaxial Si / Pr2O3 / Si(111) Heterostructures

2005 ◽  
Vol 108-109 ◽  
pp. 741-748 ◽  
Author(s):  
P. Zaumseil ◽  
T. Schroeder ◽  
G. Weidner
Keyword(s):  
Structural Characterization ◽  
Hexagonal Phase ◽  
Grazing Incidence ◽  
Interface Roughness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Perfection ◽  
Transmission Electron ◽  
Control Layer

The use of heteroepitaxial Si / Pr2O3 / Si(111) systems as semiconductor-insulatorsemiconductor (SIS) stacks in future applications requires a detailed structural characterization. We used X-ray reflectivity (XRR) to control layer thickness and interface roughness, standard X-ray diffraction (XRD) to analyze the Pr2O3 phase, orientation and crystal perfection, and grazing incidence XRD to study the thin epitaxial Si top layer. Transmission electron microscopy (TEM) was used to prove the results by direct imaging on a microscopic scale. Pr2O3 grows epitaxially in its hexagonal phase and (0001) orientation on Si(111) substrates. An epitaxial Si overgrowth in (111) orientation and good perfection is possible, but such Si layers exhibit two stacking twins, one with the same in-plane orientation as the substrate and one rotated by 180° around the Si [111] direction.

Structural Characterization of Valinomycin and Nonactin at the Air−Solution Interface by Grazing Incidence X-ray Diffraction

1997 ◽  
Vol 119 (46) ◽  
pp. 11211-11216 ◽  
Author(s):  
Hanna Rapaport ◽  
Ivan Kuzmenko ◽  
Kristian Kjaer ◽  
Paul Howes ◽  
Wim Bouwman ◽  
...  
Keyword(s):  
Structural Characterization ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Solution Interface

Structural Characterization of Metal Phosphonate Langmuir−Blodgett Films by Grazing Incidence X-ray Diffraction

Langmuir ◽  
2002 ◽  
Vol 18 (21) ◽  
pp. 8260-8262 ◽  
Author(s):  
Jeffrey T. Culp ◽  
Mark Davidson ◽  
Randolph S. Duran ◽  
Daniel R. Talham
Keyword(s):  
Structural Characterization ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Langmuir Blodgett ◽  
Metal Phosphonate ◽  
Langmuir Blodgett Films

scholarly journals Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

1997 ◽  
Vol 306 (2) ◽  
pp. 198-204 ◽  
Author(s):  
A.A. Darhuber ◽  
J. Stangl ◽  
V. Holy ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Assembled
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