Simultaneous in Situ Total Internal Reflectance Fluorescence/Atomic Force Microscopy Studies of DPPC/dPOPC Microdomains in Supported Planar Lipid Bilayers

2003 ◽  
Vol 125 (39) ◽  
pp. 11838-11839 ◽  
Author(s):  
James E. Shaw ◽  
Andrea Slade ◽  
Christopher M. Yip
Keyword(s):  
Atomic Force Microscopy ◽  
Lipid Bilayers ◽  
Planar Lipid Bilayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Total Internal Reflectance ◽  
Internal Reflectance

Biological applications of atomic-force microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1138-1139
Author(s):  
Jie Yang ◽  
Avril V. Somlyo ◽  
Michael K. Reedy ◽  
Kunio Takeyasu ◽  
Lukas K. Tamm ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lipid Bilayers ◽  
Crystal Surfaces ◽  
Whole Cells ◽  
Force Microscopy ◽  
Atomic Structures ◽  
Functional Relationships ◽  
Cubic Lattices ◽  
Atomic Force

Atomic force microscopy (AFM) has been successfully applied to image many biological specimens such as proteins, DNA molecules, membrane fragments, synthetic lipid bilayers and monolayers and even whole cells, with a resolution ranging from hundreds of nm to sub-nm. In particular, AFM has a unique capability of operating in solutions; thus, proteins in situ can be directly imaged to study their functional relationships to the structure. Because in AFM, the contrast reflects direct force interactions between the probe and the specimen surface, the resolution of AFM images is highly dependent on the specimen being studied. We, and others, found that atomic resolution images on hard crystal surfaces are among the easiest to be obtained in AFM. For example, periodic surface atomic structures with hexagonal, rhombohedral, and cubic lattices were clearly resolved by AFM [9-12]. Using the NanoScope II AFM with various home-made accessories, such as motion stages and fluid cells, we have studied several different biological materials with a resolution from tens of nm to subnm.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

2001 ◽  
Vol 167 (1) ◽  
pp. 139-151 ◽  
Author(s):  
Connie J. Rossini ◽  
Justinn F. Arceo ◽  
Evan R. McCarney ◽  
Brian H. Augustine ◽  
Douglas E. Dennis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force
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