X-ray absorption edge and EXAFS study of the copper sites in zinc oxide methanol synthesis catalysts

1989 ◽  
Vol 111 (18) ◽  
pp. 7103-7109 ◽  
Author(s):  
Lung Shan Kau ◽  
Keith O. Hodgson ◽  
Edward I. Solomon
Keyword(s):  
Zinc Oxide ◽  
Methanol Synthesis ◽  
Absorption Edge ◽  
X Ray ◽  
Synthesis Catalysts ◽  
Exafs Study ◽  
Copper Sites ◽  
X Ray Absorption ◽  
Methanol Synthesis Catalysts

In situ x-ray diffraction and x-ray absorption investigations of methanol synthesis catalysts derived from CeCu2

1991 ◽  
Vol 9 (1-2) ◽  
pp. 197-202 ◽  
Author(s):  
E.A. Shaw ◽  
T. Rayment ◽  
A.P. Walker ◽  
R.M. Lambert ◽  
T. Gauntlett ◽  
...  
Keyword(s):  
Methanol Synthesis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Synthesis Catalysts ◽  
X Ray Absorption ◽  
Methanol Synthesis Catalysts

An EXAFS study of photographic development in thermographic films

2007 ◽  
Vol 22 (2) ◽  
pp. 122-125 ◽  
Author(s):  
T. N. Blanton ◽  
D. R. Whitcomb ◽  
S. T. Misture
Keyword(s):  
Fine Structure ◽  
Absorption Edge ◽  
Thermal Processing ◽  
Real Space ◽  
Metallic Silver ◽  
X Ray ◽  
The Real ◽  
Edge Location ◽  
Exafs Study ◽  
X Ray Absorption

Silver K edge extended X-ray absorption fine structure (EXAFS) spectroscopy of films containing silver behenate (AgBeh) in the unprocessed, fully processed, and step-processed states has been performed. The results of the EXAFS analysis indicate that the intensity for the real-space peak for the Ag-O distance (∼2.3 Å) decreases while the real-space peak for the Ag-Ag distance (∼2.9 Å) grows with increasing thermal processing of the film. The changes observed in the real-space EXAFS signal indicate the growth of metallic silver at the expense of AgBeh. The X-ray absorption near-edge spectroscopy (XANES) portion of the signal shows that the absorption edge position varies stepwise, with unprocessed films and pure AgBeh having an edge location at 25 506 eV, films processed from steps 1 through 10 have an absorption edge at 25 508 eV, and the fully processed film has an edge location at 25 512 eV.

In-situ X-ray diffraction structural investigation of methanol synthesis catalysts derived from CeCu2

1990 ◽  
Vol 67 (1) ◽  
pp. 151-157 ◽  
Author(s):  
Elizabeth A. Shaw ◽  
Trevor Rayment ◽  
Andrew P. Walker ◽  
Richard M. Lambert
Keyword(s):  
Methanol Synthesis ◽  
Structural Investigation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Synthesis Catalysts ◽  
Methanol Synthesis Catalysts
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