Two-step laser excitation fluorescence study of the reactions of the 1-naphthylmethyl radical produced in the 248-nm krypton fluoride laser photolysis of 1-(chloromethyl)naphthalene in hexane at room temperature

1985 ◽  
Vol 89 (24) ◽  
pp. 5147-5149 ◽  
Author(s):  
Kunihiro Tokumura ◽  
Masahiro Udagawa ◽  
Michiya Itoh
ACS Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 550-556
Author(s):  
Javier Hernandez-Rueda ◽  
Marc L. Noordam ◽  
Irina Komen ◽  
L. Kuipers

2021 ◽  
pp. 2150392
Author(s):  
B. D. Urmanov ◽  
M. S. Leanenia ◽  
G. P. Yablonskii ◽  
O. B. Taghiyev ◽  
K. O. Taghiyev ◽  
...  

Photoluminescence properties of [Formula: see text] chalcogenide semiconductors have been studied under the impulse laser excitation in the range of 10–105 W/cm2 at room temperature. This study has shown that as a result of excitation, photoluminescence of [Formula: see text] is characterized by the emission in the interval of 450–575 nm with significant domination in the spectra line at 660 nm. Photoluminescence of [Formula: see text] quenches at wavelengths of 560 nm and 660 nm with constant time frames 258 ns and 326 ns, respectively. Moreover, the temperature measurements of photoluminescence were performed on the samples in the temperature range of 10–300 K.


1999 ◽  
Vol 259 (1-3) ◽  
pp. 23-30 ◽  
Author(s):  
M. Bouderbala ◽  
H. Mohmoh ◽  
A. Bahtat ◽  
M. Bahtat ◽  
M. Ouchetto ◽  
...  

2007 ◽  
Vol 31 ◽  
pp. 74-76 ◽  
Author(s):  
P.T. Huy ◽  
P.H. Duong

Photoluminescence (PL) from silicon nanocrystals deposited on top of silica-glass template and from silicon nanocrystals in nc_Si/SiO2 multilayer films were studied as a function of ultraviolet (UV) laser irradiation time in vacuum. Both the films exhibit intense visible PL at room temperature under laser excitation. It was found that upon prolong irradiation time using a He-Cd laser (325 nm) the PL intensity of the films was spectacularly enhanced. The process is reversible and does not happen with excitation wavelength longer than 400 nm. Upon introducing air into the measurement chamber, a rapid decrease of the PL intensity was recorded. This observation suggests that the UV light may lead to modification of nonradiative recombination centers in the films and thus improves the emission yield of silicon nanocrystals.


1998 ◽  
Vol 513 ◽  
Author(s):  
B. K. Lee ◽  
A. J. Steckl ◽  
J. M. Zavada ◽  
R. G. Wilson

ABSTRACTThe effect of the incorporation and annealing of deuterium in 3C-SiC on its photoluninescence is reported. A 3C-SiC crystal has been implanted with 100 keV deuterium and subsequently annealed at temperatures between 1015 °C and 1220 °C for 1 to 5 minutes. SIMS depth profiles indicate hydrogen is strongly trapped by defects generated through ion bombardment, but a gradual damage repairing occurs during annealing. Photoluminescence was measured with 488 nm Ar laser excitation for sample temperatures from 89 K to 400 K. The PL peak wavelength of 540 nm at room temperature has shifted to 538 nm at 89 K. The peak PL intensity decreases with measurement temperature while its full width at half maximum (FWHM) exhibits an increasing trend. PL data were taken at five annealing stages. The post-implantation peak PL intensity and its integrated area increase initially with annealing temperature and time. After the final annealing at 1218 °C for 2 minute, PL intensity and its integrated area exhibit a decrease in level.


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