Characterization of evaporated silicon and silicon monoxide films by inelastic electron tunneling spectroscopy

1992 ◽  
Vol 96 (4) ◽  
pp. 1848-1854 ◽  
Author(s):  
Morihide Higo ◽  
Kouichi Nishino ◽  
Satsuo Kamata
Sign in / Sign up

Export Citation Format

Share Document