Crystal Structure and Growth Mechanism of Lead Monoxide Thin Films Produced by Pulsed Laser Deposition

1994 ◽  
Vol 98 (50) ◽  
pp. 13308-13313 ◽  
Author(s):  
Mitra I. Baleva ◽  
Luchezar N. Bozukov ◽  
Veneta D. Tuncheva
2003 ◽  
Vol 123 (9) ◽  
pp. 939-944
Author(s):  
Takeshi Hara ◽  
Tsuyoshi Yoshitake ◽  
Takasi Nishiyama ◽  
Kunihito Nagayama

1998 ◽  
Vol 136 (3) ◽  
pp. 173-177 ◽  
Author(s):  
Chunling Li ◽  
Dafu Cui ◽  
Yueliang Zhou ◽  
Huibin Lu ◽  
Zhenghao Chen ◽  
...  

2007 ◽  
Vol 1034 ◽  
Author(s):  
Seiji Nakashima ◽  
Dan Ricinschi ◽  
Yoshitaka Nakamura ◽  
Masanori Okuyama ◽  
Hironori Fujisawa ◽  
...  

AbstractAn Influence of stress of crystal structure of polycrystalline BiFeO3 (BFO) thin film on membrane structure has been investigated. To confirm the stress dependence of the crystal structure, reciprocal space mapping measurement of polycrystalline BFO thin films on Pt (200 nm)/TiO2 (50 nm)/SiO2 (600 nm)/Si (625 μm) plate substrate and Pt (200 nm)/TiO2 (50 nm)/SiO2 (600 nm)/Si (15 μm) membrane substrate have been performed. These BFO thin films have been prepared by pulsed laser deposition (PLD). The obtained BFO thin films were polycrystalline and mainly oriented to (001) and (110) plane. From reciprocal space mapping measurement, (110) oriented BFO grains on Pt/TiO2/SiO2/Si (15 μm) membrane substrate were expanded perpendicularly to the film plane about 0.15% and compressed in parallel to the film plane about 0.7% comparing to that on Pt/TiO2/SiO2/Si (625 μm) plate substrate. And (001) oriented BFO grains on the Pt/TiO2/SiO2/Si membrane substrate were expanded about 0.20% perpendicularly to the film plane and compressed about 1.3% in parallel to the film plane comparing to that on Pt/TiO2/SiO2/Si (625 μm) plate substrat


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