In situ x-ray absorption fine structure studies of foreign metal ions in nickel hydrous oxide electrodes in alkaline electrolytes

1994 ◽  
Vol 98 (40) ◽  
pp. 10269-10276 ◽  
Author(s):  
Sunghyun Kim ◽  
Donald A. Tryk ◽  
Mark R. Antonio ◽  
Roger Carr ◽  
Daniel Scherson
1997 ◽  
Vol 75 (11) ◽  
pp. 1721-1729 ◽  
Author(s):  
Yining Hu ◽  
In Tae Bae ◽  
Yibo Mo ◽  
Daniel A. Scherson ◽  
Mark R. Antonio

X-ray absorption fine structure (XAFS) and optical reflectance spectroscopy (RS) have been used to examine in situ electronic and structural aspects of nickel hydrous oxide, α-Ni(OH)2(hyd), electrodes supported on gold in alkaline electrolytes as a function of their state of charge. The extended X-ray absorption fine structure (EXAFS) of α-Ni(OH)2(hyd) electrodes in the uncharged (UC, or discharged) and overcharged (OC, orfully charged) states yielded, in each case, a single set of two distinct nearest-neighbor shells, with distances, d(Ni—O)1 = 2.05 ± 0.02 Å and d(Ni—Ni)1 = 3.11 ± 0.02 Å for UC, and d(Ni—O)1 = 1.87 ± 0.02 Å and d(Ni—Ni)1 = 2.83 ± 0.02 Å for OC. The in situ EXAFS of films allowed to self-discharge following overcharge could be fit with contributions from both sets of shells, suggesting that only two types of nickel sites are sufficient to account for the redox chemistry of this material. These data, in addition to information derived both from quantitative X-ray absorption near-edge structure (XANES) and optical RS in the visible range, indicate that the excess anodic charge, i.e., beyond the one-electron oxidation of Ni2+ sites, observed during the first oxidation of freshly prepared α-Ni(OH)2(hyd) electrodes may not be related to oxidation state changes involving nickel sites in the lattice, and, therefore, do not support the existence of nickel sites with a formal oxidation state higher than three for charged or overcharged electrodes in this media. Keywords: nickel oxide, reflectance spectroscopy, EXAFS, in situ measurements.


1995 ◽  
Vol 142 (3) ◽  
pp. 824-828 ◽  
Author(s):  
Donald A. Tryk ◽  
In Tae Bae ◽  
Yining Hu ◽  
Sunghyun Kim ◽  
Mark R. Antonio ◽  
...  

Author(s):  
Kazumasa Murata ◽  
Junya Ohyama ◽  
Atsushi Satsuma

In the present study, the redispersion behavior of Ag particles on ZSM-5 in the presence of coke was observed using in situ X-ray absorption fine structure (XAFS) spectroscopy.


2021 ◽  
Author(s):  
Gregory M. Su ◽  
Han Wang ◽  
Brandon R. Barnett ◽  
Jeffrey R. Long ◽  
David Prendergast ◽  
...  

In situ near edge X-ray absorption fine structure spectroscopy directly probes unoccupied states associated with backbonding interactions between the open metal site in a metal–organic framework and various small molecule guests.


2003 ◽  
Vol 107 (46) ◽  
pp. 12562-12565 ◽  
Author(s):  
Shuji Matsuo ◽  
Ponnusamy Nachimuthu ◽  
Dennis W. Lindle ◽  
Hisanobu Wakita ◽  
Rupert C. C. Perera

2003 ◽  
Vol 798 ◽  
Author(s):  
V. Katchkanov ◽  
J. F. W. Mosselmans ◽  
S. Dalmasso ◽  
K. P. O'Donnell ◽  
R. W. Martin ◽  
...  

ABSTRACTThe local structure around Er and Eu atoms introduced into GaN epilayers was studied by means of Extended X-ray Absorption Fine Structure above the appropriate rare-earth X-ray absorption edge. The samples were doped in situ during growth by Molecular Beam Epitaxy. The formation of ErN clusters was found in samples with high average Er concentrations of 32±6% and 12.4±0.8%, estimated by Wavelength Dispersive X-ray analysis. When the average Er concentration is decreased to 6.0±0.2%, 1.6±0.2% and 0.17±0.02%, Er is found in localised clusters of ErGaN phase with high local Er content. Similar behaviour is observed for Eu-doped samples. For an average Eu concentration of 30.5±0.5% clusters of pure EuN occur. Decreasing the Eu concentration to 10.4±0.5% leads to EuGaN clusters with high local Eu content. However, for a sample with an Eu concentration of 14.2±0.5% clustering of Eu was not observed.


2016 ◽  
Vol 1133 ◽  
pp. 429-433
Author(s):  
Siti Nooraya Mohd Tawil ◽  
Shuichi Emura ◽  
Daivasigamani Krishnamurthy ◽  
Hajime Asahi

Local structures around gadolinium atoms in rare-earth (RE)-doped InGaGdN thin films were studied by means of fluorescence extended X-ray absorption fine structure (EXAFS) measured at the Gd LIII-edges. The samples were doped with Gd in-situ during growth by plasma-assisted molecular beam epitaxy (PAMBE). Gd LIII-edge EXAFS signal from the GaGdN, GdN and Gd foil were also measured as reference. The X-ray absorption near edge structure (XANES) spectra around Gd LIII absorption edge of InGaGdN samples observed at room temperature indicated the enhancement of intensities with the increase of Gd composition. Further EXAFS analysis inferred that the Gd atoms in InGaN were surrounded by similar atomic shells as in the case of GaGdN with the evidence indicating majority of Gd atoms substituted into Ga sites of InGaGdN. A slight elongation of bond length for the 2nd nearest-neighbor (Gd–Ga) of sample with higher Gd concentration was also observed.


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