Structure Sensitivity in the Surface Chemistry of Ice: Acetone Adsorption on Amorphous and Crystalline Ice Films

1994 ◽  
Vol 98 (28) ◽  
pp. 6900-6902 ◽  
Author(s):  
Jason E. Schaff ◽  
Jeffrey T. Roberts
Keyword(s):  
Surface Chemistry ◽  
Structure Sensitivity ◽  
Acetone Adsorption ◽  
Ice Films

Abstract: Structure sensitivity, steric hindrance, and surface chemistry

1974 ◽  
Vol 11 (1) ◽  
pp. 249-249
Author(s):  
Robert L. Burwell ◽  
Harold H. Kung ◽  
Donald Barry
Keyword(s):  
Surface Chemistry ◽  
Steric Hindrance ◽  
Structure Sensitivity ◽  
Abstract Structure

Photoluminescence behavior of silicon nanocrystals: Role of surface chemistry and size

2008 ◽  
Author(s):  
Anoop Gupta ◽  
Folarin Erogbogbo ◽  
Mark T. Swihart ◽  
Hartmut Wiggers
Keyword(s):  
Surface Chemistry ◽  
Silicon Nanocrystals ◽  
Photoluminescence Behavior

Improved Autoadhesion Measurement Method for Micromachined Polysilicon Beams

1996 ◽  
Vol 444 ◽  
Author(s):  
Maarten P. de Boer ◽  
Terry A. Michalske
Keyword(s):  
Surface Chemistry ◽  
Optical Microscopy ◽  
Measurement Method ◽  
Current Practice ◽  
Cantilever Beams ◽  
Beam Length ◽  
Substrate Adhesion

AbstractWe have measured autoadhesion (e.g. stiction) of individual polysilicon beams by interferometric optical microscopy. Untreated cantilever beams were dried from water in air, while treated beams were coated with a hydrophobic molecular coating of octadecyltrichlorosilane (ODTS). Adhesion values obtained for beams adhered to the substrate over a long length (large d) are independent of beam length with values of 16.7 and 4.4 mJ/m2 for untreated and treated samples respectively. These values can be understood in terms of differences in surface chemistry and polysilicon roughness. Using the shortest length beam which remains attached to the substrate, adhesion values were 280 and 16 mJ/m2 respectively. These higher values may be a result of capillarity effects. We recommend that measurements be made on beams in which d is large, in contrast to the current practice of noting the shortest beam adhered.

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