Orientational Ordering Transition in Solid C60: DSC, HPLC, and X-ray Studies

1995 ◽  
Vol 99 (43) ◽  
pp. 16116-16118 ◽  
Author(s):  
Eugueni V. Skokan ◽  
Victoriya E. Alioshina ◽  
Felix M. Spiridonov ◽  
Igor V. Arkhangelsky ◽  
Vladimir Ya. Davydov ◽  
...  
Author(s):  
X.-M. Zhu ◽  
H. Zabel

A Monte Carlo simulation of an ordering phase transition in the surface region of a f.c.c.-type A 3 B binary alloy is reported. The main emphasis of this simulation is the evaluation of short and long-range-order correlations near the surface which are used for calculating X-ray intensities under grazing-incident-angle conditions. These calculations suggest effective ways of conducting surface diffraction experiments on order-disorder phase transitions. The simulation results are also compared with available experimental data.


1993 ◽  
Vol 62 (4) ◽  
pp. 1131-1134 ◽  
Author(s):  
Yutaka Maniwa ◽  
Atsushi Ohi ◽  
Kenji Mizoguchi ◽  
Kiyoshi Kume ◽  
Koichi Kikuchi ◽  
...  

1999 ◽  
Vol 602 ◽  
Author(s):  
W. Prellier ◽  
Amlan Biswas ◽  
M. Rajeswari ◽  
T. Venkatesan ◽  
R.L. Greene

AbstractWe report the growth and characterization of Nd0.5Sr0.5MnO3 thin films deposited by the Pulsed Laser Deposition (PLD) technique on [100]-oriented LaAlO3 substrates. X-ray diffraction (XRD) studies show that the films are [101]-oriented, with a strained and quasi-relaxed component, the latter increasing with film thickness. A post-annealing under oxygen leads to a quasi-relaxed film with a metallic behavior. We also observe that transport properties are strongly dependent on the thickness of the films. Variable temperature XRD down to 100 K suggests that this is caused by substrate-induced strain on the films.


2005 ◽  
Vol 95 (13) ◽  
Author(s):  
I. Zegkinoglou ◽  
J. Strempfer ◽  
C. S. Nelson ◽  
J. P. Hill ◽  
J. Chakhalian ◽  
...  

1988 ◽  
Vol 65 (2) ◽  
pp. 353-358 ◽  
Author(s):  
M.T. Dove ◽  
B.M. Powell ◽  
G.S. Pawley ◽  
L.S. Bartell

1991 ◽  
Vol 66 (22) ◽  
pp. 2911-2914 ◽  
Author(s):  
Paul A. Heiney ◽  
John E. Fischer ◽  
Andrew R. McGhie ◽  
William J. Romanow ◽  
Arnold M. Denenstein ◽  
...  

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