Analysis of the Refractive Indices of TiO2, TiOF2, and TiF4:  Concept of Optical Channel as a Guide To Understand and Design Optical Materials

2005 ◽  
Vol 44 (10) ◽  
pp. 3589-3593 ◽  
Author(s):  
Xavier Rocquefelte ◽  
Fabrice Goubin ◽  
Yvan Montardi ◽  
Nicolas Viadere ◽  
Alain Demourgues ◽  
...  
Keyword(s):  
Optical Materials ◽  
Optical Channel ◽  
Refractive Indices

Analysis of the Refractive Indices of TiO2, TiOF2, and TiF4: Concept of Optical Channel as a Guide to Understand and Design Optical Materials.

ChemInform ◽  
2005 ◽  
Vol 36 (28) ◽  
Author(s):  
Xavier Rocquefelte ◽  
Fabrice Goubin ◽  
Yvan Montardi ◽  
Nicolas Viadere ◽  
Alain Demourgues ◽  
...  
Keyword(s):  
Optical Materials ◽  
Optical Channel ◽  
Refractive Indices

Development of Low-Cost Abbe Refractometer

2018 ◽  
Vol 879 ◽  
pp. 227-233
Author(s):  
Weeratouch Pongruengkiat ◽  
Thitika Jungpanich ◽  
Kodchakorn Ittipornnuson ◽  
Suejit Pechprasarn ◽  
Naphat Albutt
Keyword(s):  
Refractive Index ◽  
Optical Materials ◽  
Low Cost ◽  
Optical Component ◽  
Refractive Indices ◽  
Constant Number ◽  
Optical Wavelength ◽  
Refractive Index Spectrum ◽  
Transparent Polymers ◽  
Abbe Refractometer

Refractive index and Abbe number are major physical properties of optical materials including glasses and transparent polymers. Refractive index is, in fact, not a constant number and is varied as a function of optical wavelength. The full refractive index spectrum can be obtained using a spectrometer. However, for optical component designers, three refractive indices at the wavelengths of 486.1 nm, 589.3 nm and 656.3 nm are usually sufficient for most of the design tasks, since the rest of the spectrum can be predicted by mathematical models and interpolation. In this paper, we propose a simple optical instrumental setup that determines the refractive indices at three wavelengths and the Abbe number of solid and liquid materials.

Average value of the shape and direction factor in the equation of refractive index

2017 ◽  
Vol 31 (29) ◽  
pp. 1750263 ◽  
Author(s):  
Tao Zhang
Keyword(s):  
Refractive Index ◽  
Theoretical Calculation ◽  
Calculation Method ◽  
Electromagnetic Induction ◽  
Optical Materials ◽  
Electron Cloud ◽  
Refractive Indices ◽  
Average Value ◽  
Electron Clouds ◽  
Induction Energy

The theoretical calculation of the refractive indices is of great significance for the developments of new optical materials. The calculation method of refractive index, which was deduced from the electron-cloud-conductor model, contains the shape and direction factor [Formula: see text]. [Formula: see text] affects the electromagnetic-induction energy absorbed by the electron clouds, thereby influencing the refractive indices. It is not yet known how to calculate [Formula: see text] value of non-spherical electron clouds. In this paper, [Formula: see text] value is derived by imaginatively dividing the electron cloud into numerous little volume elements and then regrouping them. This paper proves that [Formula: see text] when molecules’ spatial orientations distribute randomly. The calculations of the refractive indices of several substances validate this equation. This result will help to promote the application of the calculation method of refractive index.

Photon Scanning Tunneling Microscopy of Optical Wavegnide Structures

1994 ◽  
Vol 332 ◽  
Author(s):  
Ahn Goo Choo ◽  
Mona H. Chudgar ◽  
Howard E Jackson ◽  
Gregory N. De Brabander ◽  
Mukesh Kumar ◽  
...  
Keyword(s):  
Refractive Index ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Optical Channel ◽  
Refractive Indices ◽  
Tunneling Microscopy ◽  
Model Calculations ◽  
Semiconductor Heterostructure ◽  
Channel Waveguides ◽  
Tapered Optical Fiber

ABSTRACTPhoton scanning tunneling microscopy (PSTM) has been used to obtain effective refractive indices of optical channel waveguide structures. The local evanescent field intensity associated with the propagation modes of optical channel waveguides are measured at two different wavelengths. Both a tapered optical fiber tip and a semiconductor heterostructure tip are employed for detection. Local values of effective refractive index are measured for both TE and TM polarizations and compared to model calculations.

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