Direct Determination of Cadmium Speciation in Municipal Solid Waste Fly Ashes by Synchrotron Radiation Induced μ-X-ray Fluorescence and μ-X-ray Absorption Spectroscopy

2002 ◽  
Vol 36 (14) ◽  
pp. 3165-3169 ◽  
Author(s):  
Andrea Somogyi ◽  
Alexandre S. Simionovici ◽  
Stuart Ansell ◽  
Britt-Marie Steenari ◽  
Oliver Lindqvist
Keyword(s):  
Synchrotron Radiation ◽  
Municipal Solid Waste ◽  
Solid Waste ◽  
Direct Determination ◽  
Fly Ashes ◽  
X Ray ◽  
Cadmium Speciation ◽  
Radiation Induced ◽  
X Ray Absorption

Synchrotron radiation induced μ-X-ray fluorescence spectroscopy on municipal solid waste fly ashes

2001 ◽  
Vol 56 (8) ◽  
pp. 1355-1365 ◽  
Author(s):  
Maria Caterina Camerani ◽  
Andrea Somogyi ◽  
Mikael Drakopoulos ◽  
Britt-Marie Steenari
Keyword(s):  
Synchrotron Radiation ◽  
Fluorescence Spectroscopy ◽  
Municipal Solid Waste ◽  
Solid Waste ◽  
Fly Ashes ◽  
X Ray ◽  
Radiation Induced

Microextended X-ray Absorption Fine Structure Studies of Cadmium Speciation within Single Municipal Solid Waste Fly Ash Particles

2004 ◽  
Vol 76 (6) ◽  
pp. 1596-1602 ◽  
Author(s):  
Maria Caterina Camerani Pinzani ◽  
Stuart Ansell ◽  
Andrea Somogyi ◽  
Britt-Marie Steenari ◽  
Oliver Lindqvist
Keyword(s):  
Fine Structure ◽  
Fly Ash ◽  
Municipal Solid Waste ◽  
Solid Waste ◽  
X Ray ◽  
Absorption Fine ◽  
Cadmium Speciation ◽  
X Ray Absorption

Direct determination of oxidation state of gold deposits in metal-reducing bacterium Shewanella algae using X-ray absorption near-edge structure spectroscopy (XANES)

2007 ◽  
Vol 103 (6) ◽  
pp. 568-571 ◽  
Author(s):  
Yasuhiro Konishi ◽  
Takeshi Tsukiyama ◽  
Norizoh Saitoh ◽  
Toshiyuki Nomura ◽  
Shinsuke Nagamine ◽  
...  
Keyword(s):  
Oxidation State ◽  
Direct Determination ◽  
Gold Deposits ◽  
Edge Structure ◽  
X Ray ◽  
Shewanella Algae ◽  
X Ray Absorption

Direct determination of Mn occupations in Ga1−xMnxN dilute magnetic semiconductors by x-ray absorption near-edge structure spectroscopy

2006 ◽  
Vol 89 (12) ◽  
pp. 121901 ◽  
Author(s):  
Shiqiang Wei ◽  
Wensheng Yan ◽  
Zhihu Sun ◽  
Qinghua Liu ◽  
Wenjie Zhong ◽  
...  
Keyword(s):  
Magnetic Semiconductors ◽  
Dilute Magnetic Semiconductors ◽  
Direct Determination ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

A setup for synchrotron-radiation-induced total reflection X-ray fluorescence and X-ray absorption near-edge structure recently commissioned at BESSY II BAMline

2016 ◽  
Vol 23 (3) ◽  
pp. 820-824 ◽  
Author(s):  
U. Fittschen ◽  
A. Guilherme ◽  
S. Böttger ◽  
D. Rosenberg ◽  
M. Menzel ◽  
...  
Keyword(s):  
Accurate Determination ◽  
Total Reflection ◽  
Edge Structure ◽  
X Ray ◽  
Unknown Species ◽  
Radiation Induced ◽  
Set Up ◽  
Reflecting Surface ◽  
X Ray Absorption

An automatic sample changer chamber for total reflection X-ray fluorescence (TXRF) and X-ray absorption near-edge structure (XANES) analysis in TXRF geometry was successfully set up at the BAMline at BESSY II. TXRF and TXRF-XANES are valuable tools for elemental determination and speciation, especially where sample amounts are limited (<1 mg) and concentrations are low (ng ml−1to µg ml−1). TXRF requires a well defined geometry regarding the reflecting surface of a sample carrier and the synchrotron beam. The newly installed chamber allows for reliable sample positioning, remote sample changing and evacuation of the fluorescence beam path. The chamber was successfully used showing accurate determination of elemental amounts in the certified reference material NIST water 1640. Low limits of detection of less than 100 fg absolute (10 pg ml−1) for Ni were found. TXRF-XANES on different Re species was applied. An unknown species of Re was found to be Re in the +7 oxidation state.

Soft X-Ray Absorption Microscopy of Surfaces with Synchrotron Radiation

1988 ◽  
Vol 143 ◽  
Author(s):  
G. R. Harp ◽  
B. P. Tonner
Keyword(s):  
Synchrotron Radiation ◽  
Sample Surface ◽  
Spectroscopic Technique ◽  
Solid Surfaces ◽  
Chemical Information ◽  
Secondary Electrons ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

AbstractAs a spectroscopic technique, x-ray absorption near-edge structure (XANES) of core-levels using synchrotron radiation is in wide-spread use for the determination of the molecular composition of solid surfaces. A common detection method measures the yield of secondary electrons, which is proportional to the x-ray absorption coefficient for sufficiently high photon energy. In the experiments reported here, we show how the secondary electrons emitted as a result of photoabsorption can be used to generate a magnified image of the sample surface, with fundamental spatial limits determined by the deBroglie wavelength of the emitted electrons. Contrast in the secondary electron spatial distribution contains both topographical and chemical information about the sample surface. The use of tunable synchrotron radiation enables us to separate these contributions to the microscopic image, and to spatially resolve surface chemical composition as reflected in micro-XANES spectra.

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