scholarly journals Chemical Structures of Low-Pressure Premixed Methylcyclohexane Flames as Benchmarks for the Development of a Predictive Combustion Chemistry Model

2011 ◽  
Vol 25 (12) ◽  
pp. 5611-5625 ◽  
Author(s):  
Scott A. Skeen ◽  
Bin Yang ◽  
Ahren W. Jasper ◽  
William J. Pitz ◽  
Nils Hansen
2011 ◽  
Vol 33 (1) ◽  
pp. 593-600 ◽  
Author(s):  
Yuyang Li ◽  
Jianghuai Cai ◽  
Lidong Zhang ◽  
Tao Yuan ◽  
Kuiwen Zhang ◽  
...  

2011 ◽  
Vol 225 (9-10) ◽  
pp. 1029-1054 ◽  
Author(s):  
Patrick Oßwald ◽  
Katharina Kohse-Höinghaus ◽  
Ulf Struckmeier ◽  
Thomas Zeuch ◽  
Lars Seidel ◽  
...  

Author(s):  
L.H. Bolz ◽  
D.H. Reneker

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.


Author(s):  
Gert Ehrlich

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.


Author(s):  
N.-H. Cho ◽  
K.M. Krishnan ◽  
D.B. Bogy

Diamond-like carbon (DLC) films have attracted much attention due to their useful properties and applications. These properties are quite variable depending on film preparation techniques and conditions, DLC is a metastable state formed from highly non-equilibrium phases during the condensation of ionized particles. The nature of the films is therefore strongly dependent on their particular chemical structures. In this study, electron energy loss spectroscopy (EELS) was used to investigate how the chemical bonding configurations of DLC films vary as a function of sputtering power densities. The electrical resistivity of the films was determined, and related to their chemical structure.DLC films with a thickness of about 300Å were prepared at 0.1, 1.1, 2.1, and 10.0 watts/cm2, respectively, on NaCl substrates by d.c. magnetron sputtering. EEL spectra were obtained from diamond, graphite, and the films using a JEOL 200 CX electron microscope operating at 200 kV. A Gatan parallel EEL spectrometer and a Kevex data aquisition system were used to analyze the energy distribution of transmitted electrons. The electrical resistivity of the films was measured by the four point probe method.


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