X-ray Photoelectron Spectroscopy, Photoelectron Energy Loss Spectroscopy, X-ray Excited Auger Electron Spectroscopy, and Time-of-Flight−Secondary Ion Mass Spectroscopy Studies of Asphaltenes from Doba−Chad Heavy Crude Hydrovisbreaking

Faïçal Larachi; Soumaïne Dehkissia; Alain Adnot; Esteban Chornet

doi:10.1021/ef049951e

X-ray Photoelectron Spectroscopy, Photoelectron Energy Loss Spectroscopy, X-ray Excited Auger Electron Spectroscopy, and Time-of-Flight−Secondary Ion Mass Spectroscopy Studies of Asphaltenes from Doba−Chad Heavy Crude Hydrovisbreaking

Energy & Fuels ◽

10.1021/ef049951e ◽

2004 ◽

Vol 18 (6) ◽

pp. 1744-1756 ◽

Cited By ~ 15

Author(s):

Faïçal Larachi ◽

Soumaïne Dehkissia ◽

Alain Adnot ◽

Esteban Chornet

Keyword(s):

Energy Loss ◽

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Heavy Crude ◽

Spectroscopy Studies ◽

Secondary Ion

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Auger electron spectroscopy, x‐ray photoelectron spectroscopy, and electron energy‐loss spectroscopy studies of MoSi2

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577917 ◽

1992 ◽

Vol 10 (4) ◽

pp. 2822-2825 ◽

Cited By ~ 11

Author(s):

R. S. Rastogi ◽

V. D. Vankar ◽

K. L. Chopra

Keyword(s):

Energy Loss ◽

Auger Electron Spectroscopy ◽

Electron Energy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray ◽

Spectroscopy Studies ◽

Electron Energy Loss

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The hydroxylation of passive oxide films on X-70 steel by dissolved hydrogen studied by nuclear reaction analysis, Auger electron spectroscopy, X-ray photoelectron spectroscopy and secondary ion mass spectroscopy

Thin Solid Films ◽

10.1016/j.tsf.2005.10.083 ◽

2006 ◽

Vol 503 (1-2) ◽

pp. 149-157 ◽

Cited By ~ 7

Author(s):

Chunsi Zhang ◽

Jingli Luo ◽

David Munoz-Paniagua ◽

Peter R. Norton

Keyword(s):

Auger Electron Spectroscopy ◽

Nuclear Reaction ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Nuclear Reaction Analysis ◽

X Ray ◽

Dissolved Hydrogen ◽

Secondary Ion

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A preliminary study of pure metal surfaces using Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectroscopy (SIMS)

Surface Science ◽

10.1016/0039-6028(75)90160-0 ◽

1975 ◽

Vol 53 (1) ◽

pp. 636-648 ◽

Cited By ~ 12

Author(s):

M. Gettings ◽

J.P. Coad

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Pure Metal ◽

Secondary Ion Mass Spectroscopy ◽

X Ray ◽

Preliminary Study ◽

Secondary Ion

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X-ray photoelectron spectroscopy, X-ray excited Auger electron spectroscopy and time-of-flight secondary ion mass spectroscopy characterization of carbon fibres activated by d.c. corona discharge at ambient pressure and temperature

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/s0368-2048(97)00068-6 ◽

1997 ◽

Vol 85 (3) ◽

pp. 179-191 ◽

Cited By ~ 18

Author(s):

E Desimoni ◽

A.M Salvi ◽

F Langerame ◽

J.F Watts

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ambient Pressure ◽

Carbon Fibres ◽

X Ray ◽

Secondary Ion

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State of sulphur on the palladium surface studied by auger electron spectroscopy, electron energy loss spectroscopy, ultraviolet photoelectron spectroscopy and X-ray photoelectron spectroscopy

Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases ◽

10.1039/f19807601122 ◽

1980 ◽

Vol 76 (0) ◽

pp. 1122 ◽

Cited By ~ 19

Author(s):

Yoshio Matsumoto ◽

Mitsuyuki Soma ◽

Takaharu Onishi ◽

Kenzi Tamaru

Keyword(s):

Energy Loss ◽

Auger Electron Spectroscopy ◽

Electron Energy Loss Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ultraviolet Photoelectron Spectroscopy ◽

X Ray ◽

Palladium Surface ◽

Electron Energy Loss

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Cited By ~ 44

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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X‐ray photoelectron spectroscopy and Auger electron spectroscopy studies of ferroelectric (Pb,La)TiO3thin films prepared by a multi‐ion‐beam reactive cosputtering technique

Journal of Applied Physics ◽

10.1063/1.354149 ◽

1993 ◽

Vol 74 (1) ◽

pp. 224-227 ◽

Cited By ~ 49

Author(s):

Zhenghong Qian ◽

Dingquan Xiao ◽

Jianguo Zhu ◽

Zisheng Li ◽

Changming Zuo

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Beam ◽

X Ray ◽

Spectroscopy Studies

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Auger electron spectroscopy and x‐ray photoelectron spectroscopy studies of adhesion failure of Ni/Au‐plated contacts in ceramic electronic packages

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579952 ◽

1996 ◽

Vol 14 (3) ◽

pp. 1348-1351 ◽

Cited By ~ 2

Author(s):

D. N. Braski ◽

E. D. Winters

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Electronic Packages ◽

X Ray ◽

Adhesion Failure ◽

Spectroscopy Studies

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An Auger electron spectroscopy, x-ray photoelectron spectroscopy, secondary ion mass spectrometry and bulk analysis of pyrolytic boron nitride crucibles after vacuum baking

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.583511 ◽

1986 ◽

Vol 4 (6) ◽

pp. 1310 ◽

Cited By ~ 12

Author(s):

F. A. Chambers

Keyword(s):

Mass Spectrometry ◽

Boron Nitride ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Bulk Analysis ◽

X Ray ◽

Secondary Ion

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ChemInform Abstract: SURFACE ANALYSIS: X-RAY PHOTOELECTRON SPECTROSCOPY, AUGER ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS SPECTROMETRY

Chemischer Informationsdienst ◽

10.1002/chin.198249370 ◽

1982 ◽

Vol 13 (49) ◽

Author(s):

N. H. TURNER ◽

R. J. COLTON

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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