The Chemistry of Formazan Dyes. Synthesis and Characterization of a Stable Verdazyl Radical and a Related Boron-Containing Heterocycle

2009 ◽  
Vol 86 (1) ◽  
pp. 76 ◽  
Author(s):  
David E. Berry ◽  
Robin G. Hicks ◽  
Joe B. Gilroy
2007 ◽  
Vol 31 (11) ◽  
pp. 1973 ◽  
Author(s):  
M’hamed Chahma ◽  
Keely Macnamara ◽  
Art van der Est ◽  
Antonio Alberola ◽  
Victor Polo ◽  
...  

2002 ◽  
Vol 80 (11) ◽  
pp. 1501-1506 ◽  
Author(s):  
Tosha M Barclay ◽  
Robin G Hicks ◽  
Andrew S Ichimura ◽  
Greg W Patenaude

The synthesis and characterization of a new 6-phosphaverdazyl radical incorporated into a spirocyclic framework containing a cyclotriphosphazene ring is described. Reaction of 1,1,3,3-bis[spiro-2',2''-dioxy-1',1''-biphenyl]-5,5-bis(1-methylhydrazido)-1,3,5,2,4,6-cyclotriphosphazene (7) with trimethylorthobenzoate yielded 6-[2,2,4,4-bis(2,2'-dioxy-1,1'-biphenyl)-2,4,6,1,3,5-cyclotriphosphazen-6-yl]-1,2,5,6-tetrahydro-1,5-dimethyl-3-phenyl-1,2,4,5,6-tetrazaphosphorine (8), which was characterized spectroscopically and by X-ray diffraction. Oxidation of 8 yielded 6-[2,2,4,4-bis(2,2'-dioxy-1,1'-biphenyl)-2,4,6,1,3,5-cyclotriphosphazen-6-yl]-1,5-dimethyl-3-phenyl-6-phosphaverdazyl (5), which was characterized by EPR and ENDOR spectroscopy. Analysis of both spectra indicate that spin density from the phosphaverdazyl ring induces spin polarization into the phosphazene ring, as evidenced by hyperfine coupling to all three phosphorus nuclei.Key words: heterocycle, phosphorus–nitrogen compounds, phosphazenes, stable radicals, verdazyls.


1996 ◽  
Vol 61 (10) ◽  
pp. 3572-3572
Author(s):  
Lawrence T. Scott ◽  
Atena Necula

2018 ◽  
Vol 2 (1) ◽  
pp. 7
Author(s):  
S Chirino ◽  
Jaime Diaz ◽  
N Monteblanco ◽  
E Valderrama

The synthesis and characterization of Ti and TiN thin films of different thicknesses was carried out on a martensitic stainless steel AISI 410 substrate used for tool manufacturing. The mechanical parameters between the interacting surfaces such as thickness, adhesion and hardness were measured. By means of the scanning electron microscope (SEM) the superficial morphology of the Ti/TiN interface was observed, finding that the growth was of columnar grains and by means of EDAX the existence of titanium was verified.  Using X-ray diffraction (XRD) it was possible to observe the presence of residual stresses (~ -3.1 GPa) due to the different crystalline phases in the coating. Under X-ray photoemission spectroscopy (XPS) it was possible to observe the molecular chemical composition of the coating surface, being Ti-N, Ti-N-O and Ti-O the predominant ones.


2009 ◽  
Author(s):  
Marziye Javaheri Kachousangi ◽  
Rahmatollah Rahimi ◽  
Mohamad Mehdi Kashani-Motlagh

Sign in / Sign up

Export Citation Format

Share Document