An MJF template for quantitatively assigning infrared spectral intensities

1971 ◽  
Vol 48 (7) ◽  
pp. 452 ◽  
Author(s):  
T. Durkin ◽  
L. DeHayes ◽  
J. Glore
Keyword(s):  
Infrared Spectral ◽  
Spectral Intensities

Intermolecular charge fluxes and far-infrared spectral intensities of liquid formamide

2018 ◽  
Vol 20 (5) ◽  
pp. 3029-3039 ◽  
Author(s):  
Hajime Torii
Keyword(s):  
Hydrogen Bond ◽  
Infrared Spectrum ◽  
Bond Length ◽  
Far Infrared ◽  
Hydrogen Bond Length ◽  
Intensity Enhancement ◽  
Infrared Spectral ◽  
Spectral Intensities

Intermolecular charge fluxes induced by hydrogen-bond length modulations occurring upon molecular librations lead to intensity enhancement of the far-infrared spectrum.

The Interpretation of Solar Spectral Intensities

1988 ◽  
Vol 102 ◽  
pp. 329
Author(s):  
R.W.P. McWhirter
Keyword(s):  
Emission Measure ◽  
Physical Nature ◽  
Atomic Data ◽  
The Sun ◽  
Atomic Properties ◽  
Outer Atmosphere ◽  
Spectral Intensities ◽  
Thin Plasma ◽  
Number Of Authors

The intensity of a specrtal line from an optically thin plasma such as the outer atmosphere of the sun depends on both the atomic properties of the atomic ion responsible for the line and the physical nature of the plasma. In this paper we discuss the various ways in which the measured spectral intensities from the sun are used to discover something about the nature of the sun’s atmosphere. The technique has been referred to as the emission measure method. It has important limitations in terms of the accuracy of the specrtal data as well as the atomic data. We discuss some of these and suggest methods by which they may be assessed. The technique is illustrated by application to real observations from a number of authors.

FR-IR Molecular Microanalysis System

1990 ◽  
Vol 48 (2) ◽  
pp. 270-271
Author(s):  
John A. Reffner ◽  
William T. Wihlborg
Keyword(s):  
Fourier Transform ◽  
Fourier Transform Infrared ◽  
Integrated System ◽  
Morphological Examination ◽  
Fully Integrated ◽  
Ir Microscopy ◽  
Normal Functions ◽  
Infrared Microspectroscopy ◽  
Infrared Spectral ◽  
Ft Ir

The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.

THE INTERPRETATION OF SOLAR SPECTRAL INTENSITIES

1988 ◽  
Vol 49 (C1) ◽  
pp. C1-329-C1-329 ◽  
Author(s):  
R. W.P. McWHIRTER
Keyword(s):  
Spectral Intensities

Metastructures for the Giant Enhancement of Raman Scattering in the Near Infrared Spectral Range

JETP Letters ◽  
2020 ◽  
Vol 112 (1) ◽  
pp. 31-36
Author(s):  
V. I. Kukushkin ◽  
V. E. Kirpichev ◽  
E. N. Morozova ◽  
V. V. Solov’ev ◽  
Ya. V. Fedotova ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Spectral Range ◽  
Near Infrared ◽  
Infrared Spectral Range ◽  
Infrared Spectral

scholarly journals ALD Deposited ZnO:Al Films on Mica for Flexible PDLC Devices

Nanomaterials ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 1011
Author(s):  
Dimitre Z. Dimitrov ◽  
Zih Fan Chen ◽  
Vera Marinova ◽  
Dimitrina Petrova ◽  
Chih Yao Ho ◽  
...  
Keyword(s):  
Near Infrared ◽  
Atomic Layer ◽  
Optical Transmittance ◽  
Force Microscopy ◽  
Flexible Polymer ◽  
Layer Deposition ◽  
Polymer Dispersed ◽  
Muscovite Mica ◽  
Infrared Spectral ◽  
Continuous Bending

In this work, highly conductive Al-doped ZnO (AZO) films are deposited on transparent and flexible muscovite mica substrates by using the atomic layer deposition (ALD) technique. AZO-mica structures possess high optical transmittance at visible and near-infrared spectral range and retain low electric resistivity, even after continuous bending of up to 800 cycles. Structure performances after bending tests have been supported by atomic force microscopy (AFM) analysis. Based on performed optical and electrical characterizations AZO films on mica are implemented as transparent conductive electrodes in flexible polymer dispersed liquid crystal (PDLC) devices. The measured electro-optical characteristics and response time of the proposed devices reveal the higher potential of AZO-mica for future ITO-free flexible optoelectronic applications.

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