High-Resolution Helium Atom Time-of-Flight Spectroscopy of Low-Frequency Vibrations of Adsorbates

1996 ◽  
Vol 96 (4) ◽  
pp. 1307-1326 ◽  
Author(s):  
Frank Hofmann ◽  
J. Peter Toennies
Biopolymers ◽  
1982 ◽  
Vol 21 (1) ◽  
pp. 43-50 ◽  
Author(s):  
H. D. Bartunik ◽  
P. Jollès ◽  
J. Berthou ◽  
A. J. Dianoux

Physica B+C ◽  
1986 ◽  
Vol 136 (1-3) ◽  
pp. 256-259 ◽  
Author(s):  
Stephen Cusack ◽  
Jeremy Smith ◽  
John Finney ◽  
Martin Karplus ◽  
Jill Trewhella

Author(s):  
P. A. Marsh ◽  
T. Mullens ◽  
D. Price

It is possible to exceed the guaranteed resolution on most electron microscopes by careful attention to microscope parameters essential for high resolution work. While our experience is related to a Philips EM-200, we hope that some of these comments will apply to all electron microscopes.The first considerations are vibration and magnetic fields. These are usually measured at the pre-installation survey and must be within specifications. It has been our experience, however, that these factors can be greatly influenced by the new facilities and therefore must be rechecked after the installation is completed. The relationship between the resolving power of an EM-200 and the maximum tolerable low frequency interference fields in milli-Oerstedt is 10 Å - 1.9, 8 Å - 1.4, 6 Å - 0.8.


Author(s):  
Yongyi Zhao ◽  
Ankit Raghuram ◽  
Hyun Kim ◽  
Andreas Hielscher ◽  
Jacob T Robinson ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document