Control over Memory Performance of Layer-by-Layer Assembled Metal Phthalocyanine Multilayers via Molecular-Level Manipulation

2012 ◽  
Vol 24 (6) ◽  
pp. 1091-1099 ◽  
Author(s):  
Bonkee Koo ◽  
Hyunhee Baek ◽  
Jinhan Cho
Keyword(s):  
Molecular Level ◽  
Memory Performance ◽  
Layer By Layer ◽  
Metal Phthalocyanine

Layer-by-layer assembled enzyme multilayers with adjustable memory performance and low power consumption via molecular-level control

2012 ◽  
Vol 22 (11) ◽  
pp. 4645 ◽  
Author(s):  
Hyunhee Baek ◽  
Chanwoo Lee ◽  
Jeongju Park ◽  
Younghoon Kim ◽  
Bonkee Koo ◽  
...  
Keyword(s):  
Power Consumption ◽  
Low Power ◽  
Molecular Level ◽  
Memory Performance ◽  
Low Power Consumption ◽  
Layer By Layer ◽  
Level Control

Molecular-Level Manipulation of V2O5/Polyaniline Layer-by-Layer Films To Control Electrochromogenic and Electrochemical Properties

2004 ◽  
Vol 16 (11) ◽  
pp. 2293-2299 ◽  
Author(s):  
Fritz Huguenin ◽  
Marystela Ferreira ◽  
Valtencir Zucolotto ◽  
Franscisco C. Nart ◽  
Roberto M. Torresi ◽  
...  
Keyword(s):  
Electrochemical Properties ◽  
Molecular Level ◽  
Layer By Layer

Quantification Problems in Depth Profiling of PWR Steels Using Ar+ Ion Sputtering and XPS Analysis

2006 ◽  
Vol 12 (5) ◽  
pp. 432-437 ◽  
Author(s):  
Velislava A. Ignatova ◽  
Sven Van Den Berghe ◽  
Steven Van Dyck ◽  
Vladimir N. Popok
Keyword(s):  
Photoelectron Spectroscopy ◽  
Molecular Level ◽  
Depth Profiling ◽  
Crater Depth ◽  
Elemental Distribution ◽  
Layer By Layer ◽  
Before And After ◽  
Order Of Magnitude ◽  
Spectrum Deconvolution ◽  
Vertical Scanning Interferometry

The oxide scales of AISI 304 formed in boric acid solutions at 300°C and pH = 4.5 have been studied using X-ray photoelectron spectroscopy (XPS) depth profiling. The present focus is depth profile quantification both in depth and chemical composition on a molecular level. The roughness of the samples is studied by atomic force microscopy before and after sputtering, and the erosion rate is determined by measuring the crater depth with a surface profilometer and vertical scanning interferometry. The resulting roughness (20–30 nm), being an order of magnitude lower than the crater depth (0.2–0.5 μm), allows layer-by-layer profiling, although the ion-induced effects result in an uncertainty of the depth calibration of a factor of 2. The XPS spectrum deconvolution and data evaluation applying target factor analysis allows chemical speciation on a molecular level. The elemental distribution as a function of the sputtering time is obtained, and the formation of two layers is observed—one hydroxide (mainly iron–nickel based) on top and a second one deeper, mainly consisting of iron–chromium oxides.

Improved ternary memory performance of donor–acceptor structured molecules through cyano substitution

2015 ◽  
Vol 3 (26) ◽  
pp. 6778-6785 ◽  
Author(s):  
Qijian Zhang ◽  
Hao Zhuang ◽  
Jinghui He ◽  
Shugang Xia ◽  
Hua Li ◽  
...  
Keyword(s):  
Memory Performance ◽  
Memory Devices ◽  
Layer By Layer ◽  
Layer Stacking ◽  
Donor Acceptor ◽  
Molecular Backbone

Novelty: the forming of layer by layer stacking and the realization of excellent ternary memory devices through introducing CN groups in the molecular backbone.

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