Scanning Tunneling and Atomic Force Microscopy Study of the Te-Atom Surfaces of Commensurate Layered Tellurides NbAxTe2 (A = Ge, Si)

W. Liang; M.-H. Whangbo; M. Evain; L. Monconduit; R. Brec; H. Bengel; H.-J. Cantow; S. N. Magonov

doi:10.1021/cm00041a019

Scanning Tunneling and Atomic Force Microscopy Study of the Te-Atom Surfaces of Commensurate Layered Tellurides NbAxTe2 (A = Ge, Si)

Chemistry of Materials ◽

10.1021/cm00041a019 ◽

1994 ◽

Vol 6 (5) ◽

pp. 678-685 ◽

Cited By ~ 7

Author(s):

W. Liang ◽

M.-H. Whangbo ◽

M. Evain ◽

L. Monconduit ◽

R. Brec ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Scanning Tunneling Microscopy and Atomic Force Microscopy Study on Interface between Molecular-Beam-Grown Pt Film and Si(111) Substrate

Japanese Journal of Applied Physics ◽

10.1143/jjap.34.3336 ◽

1995 ◽

Vol 34 (Part 1, No. 6B) ◽

pp. 3336-3341 ◽

Cited By ~ 4

Author(s):

Kouichi Nishikawa ◽

Masahiko Yamamoto ◽

Katsuyuki Ichimiya ◽

Yukihiro Umetani ◽

Toshiki Kingetsu

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Molecular Beam ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

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Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2

Surface Science ◽

10.1016/s0039-6028(99)00858-4 ◽

1999 ◽

Vol 441 (2-3) ◽

pp. 384-390

Author(s):

Sonia Antoranz Contera ◽

Tatsuo Yoshinobu ◽

Hiroshi Iwasaki ◽

Kenji Kisoda

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Scanning-tunneling/atomic-force microscopy study of the growth of KBr films on InSb()

Surface Science ◽

10.1016/s0039-6028(02)01438-3 ◽

2002 ◽

Vol 506 (1-2) ◽

pp. 12-22 ◽

Cited By ~ 18

Author(s):

J.J. Kolodziej ◽

B. Such ◽

P. Czuba ◽

F. Krok ◽

P. Piatkowski ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Theoretical scanning tunneling microscopy and atomic force microscopy study of graphite including tip–surface interaction

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575443 ◽

1988 ◽

Vol 6 (2) ◽

pp. 313-318 ◽

Cited By ~ 119

Author(s):

Inder P. Batra ◽

S. Ciraci

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Microscopy Study ◽

Surface Interaction ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force

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Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n=1,2) and [(Pb,Sb)S)]1.14NbS2

Surface Science ◽

10.1016/s0039-6028(97)00882-0 ◽

1998 ◽

Vol 400 (1-3) ◽

pp. 266-276 ◽

Cited By ~ 5

Author(s):

H Bengel ◽

S Jobic ◽

C Deudon ◽

J Rouxel ◽

D.-K Seo ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Microscopy Study ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Scanning tunneling and atomic force microscopy study of layered transition metal halides Nb3X8 (X = Cl, Br, I)

Journal of the American Chemical Society ◽

10.1021/ja00059a053 ◽

1993 ◽

Vol 115 (6) ◽

pp. 2495-2503 ◽

Cited By ~ 24

Author(s):

S. N. Magonov ◽

P. Zoennchen ◽

H. Rotter ◽

H. J. Cantow ◽

G. Thiele ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Transition Metal ◽

Microscopy Study ◽

Scanning Tunneling ◽

Metal Halides ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Layered Transition Metal

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Scanning tunneling microscopy and atomic force microscopy study of graphite defects produced by bombarding with highly charged ions

Journal of Applied Physics ◽

10.1063/1.366470 ◽

1997 ◽

Vol 82 (12) ◽

pp. 6037-6040 ◽

Cited By ~ 59

Author(s):

Kozo Mochiji ◽

Seiji Yamamoto ◽

Hiroshi Shimizu ◽

Shunsuke Ohtani ◽

Takashi Seguchi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Scanning Tunneling Microscopy ◽

Microscopy Study ◽

Highly Charged Ions ◽

Scanning Tunneling ◽

Atomic Force Microscopy Study ◽

Tunneling Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Charged Ions

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Nano-structural signs of the cortical bone fragility: atomic force microscopy study in the femoral neck of elderly hip fracture patients and healthy aged controls

Bone Abstracts ◽

10.1530/boneabs.1.pp48 ◽

2013 ◽

Author(s):

Petar Milovanovic ◽

Zlatko Rakocevic ◽

Jelena Potocnik ◽

Danijela Djonic ◽

Vladimir Zivkovic ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Hip Fracture ◽

Femoral Neck ◽

Cortical Bone ◽

Microscopy Study ◽

Bone Fragility ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Atomic Force Microscopy study on the effect of different lecithins in cocoa-butter based suspensions

Colloids and Surfaces A Physicochemical and Engineering Aspects ◽

10.1016/j.colsurfa.2016.03.057 ◽

2016 ◽

Vol 499 ◽

pp. 60-68 ◽

Cited By ~ 8

Author(s):

D. Middendorf ◽

U. Bindrich ◽

P. Mischnick ◽

A. Juadjur ◽

K. Franke ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cocoa Butter ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force

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Operando atomic force microscopy study of electric double-layer transistors based on ionic liquid/rubrene single crystal interfaces

Applied Physics Letters ◽

10.1063/5.0053848 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243301

Author(s):

Yusuke Morino ◽

Yasuyuki Yokota ◽

Ken-ichi Bando ◽

Hisaya Hara ◽

Akihito Imanishi ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Single Crystal ◽

Double Layer ◽

Electric Double Layer ◽

Microscopy Study ◽

Atomic Force Microscopy Study ◽

Force Microscopy ◽

Atomic Force ◽

Crystal Interfaces

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