High energy resolution x-ray photoelectron spectroscopy studies of tetracyanoquinodimethane charge transfer complexes with copper, nickel, and lithium

1989 ◽  
Vol 1 (1) ◽  
pp. 72-78 ◽  
Author(s):  
John M. Lindquist ◽  
John C. Hemminger
Keyword(s):  
Charge Transfer ◽  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Charge Transfer Complexes ◽  
X Ray ◽  
Copper Nickel ◽  
Spectroscopy Studies

In situ observation of charge transfer and crystal field formation via high energy resolution X-ray spectroscopy during temperature programmed oxidation

2020 ◽  
Vol 22 (26) ◽  
pp. 14731-14735
Author(s):  
Anna Wach ◽  
Wojciech Błachucki ◽  
Joanna Czapla-Masztafiak ◽  
Daniel Luis Abreu Fernandes ◽  
Dariusz Banaś ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
In Situ Observation ◽  
X Ray ◽  
Temperature Programmed Oxidation ◽  
Temperature Programmed ◽  
Charge Transfer Dynamics ◽  
Field Formation

In this paper, we demonstrated how high energy resolution resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten.

Submicrometre-area high-energy-resolution photoelectron spectroscopy system

1998 ◽  
Vol 5 (3) ◽  
pp. 1111-1113 ◽  
Author(s):  
Takanori Kiyokura ◽  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Eiji Shigemasa ◽  
Akira Yagishita ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Spectral Measurements ◽  
X Ray ◽  
Fermi Edge ◽  
Sample Position ◽  
Instrumental Resolution ◽  
Spectroscopy System

A submicrometre-area photoelectron spectroscopy system that uses a multi-layer-coated Schwarzschild objective as the soft X-ray microbeam optics has been developed. The system is located at an undulator beamline (BL-16U) at the Photon Factory in the High Energy Accelerator Research Organization. By knife-edge measurement, the microbeam size was estimated to be 160 nm at the sample position using a 25–75% criterion. Photoelectron spectral measurements revealed that the Fermi edge width was 0.12 eV, which means that the instrumental resolution was 0.05 eV, after removing the natural broadening of the Fermi edge at room temperature. This system offers both high energy resolution and high spatial resolution.

Soft X‐ray photoelectron spectroscopy with SR at high energy resolution

1991 ◽  
Vol 4 (3) ◽  
pp. 18-19 ◽  
Author(s):  
Eugen Weschke ◽  
Clemens Laubschat ◽  
Thomas Simmons ◽  
Michael Domke ◽  
Gunter Kaindl
Keyword(s):  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

scholarly journals Characterization of the soft X-ray spectrometer PEAXIS at BESSY II

2020 ◽  
Vol 27 (1) ◽  
pp. 238-249 ◽  
Author(s):  
Christian Schulz ◽  
Klaus Lieutenant ◽  
Jie Xiao ◽  
Tommy Hofmann ◽  
Deniz Wong ◽  
...  
Keyword(s):  
Photon Energy ◽  
Energy Resolution ◽  
Photoelectron Spectroscopy ◽  
Polarized Light ◽  
High Energy ◽  
Incident Photon Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Incident Photon ◽  
Linearly Polarized

The performance of the recently commissioned spectrometer PEAXIS for resonant inelastic soft X-ray scattering (RIXS) and X-ray photoelectron spectroscopy and its hosting beamline U41-PEAXIS at the BESSY II synchrotron are characterized. The beamline provides linearly polarized light from 180 eV to 1600 eV allowing for RIXS measurements in the range 200–1200 eV. The monochromator optics can be operated in different configurations to provide either high flux with up to 1012 photons s−1 within the focal spot at the sample or high energy resolution with a full width at half maximum of <40 meV at an incident photon energy of ∼400 eV. The measured total energy resolution of the RIXS spectrometer is in very good agreement with theoretically predicted values obtained by ray-tracing simulations. PEAXIS features a 5 m-long RIXS spectrometer arm that can be continuously rotated about the sample position by 106° within the horizontal photon scattering plane, thus enabling the study of momentum-transfer-dependent excitations. Selected scientific examples are presented to demonstrate the instrument capabilities, including measurements of excitations in single-crystalline NiO and in liquid acetone employing a fluid cell sample manipulator. Planned upgrades of the beamline and the RIXS spectrometer to further increase the energy resolution to ∼100 meV at 1000 eV incident photon energy are discussed.

Mn 2p resonant X-ray emission clarifies the redox reaction and charge-transfer effects in LiMn2O4

2019 ◽  
Vol 21 (33) ◽  
pp. 18363-18369 ◽  
Author(s):  
Daisuke Asakura ◽  
Yusuke Nanba ◽  
Eiji Hosono ◽  
Masashi Okubo ◽  
Hideharu Niwa ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Charge Transfer ◽  
Energy Resolution ◽  
Emission Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Transfer Effects ◽  
X Ray ◽  
Ion Extraction ◽  
Li Ion

High-energy-resolution soft X-ray emission spectroscopy (XES) was applied to understand the changes in the electronic structure of LiMn2O4 upon Li-ion extraction/insertion.

scholarly journals Probing CuI in homogeneous catalysis using high-energy-resolution fluorescence-detected X-ray absorption spectroscopy

2015 ◽  
Vol 51 (48) ◽  
pp. 9864-9867 ◽  
Author(s):  
Richard C. Walroth ◽  
Jacob W. H. Uebler ◽  
Kyle M. Lancaster
Keyword(s):  
Charge Transfer ◽  
Homogeneous Catalysis ◽  
Energy Resolution ◽  
Catalytic Reaction ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Ligand Charge Transfer ◽  
X Ray Absorption ◽  
Absorption Features

CuI X-ray absorption features are assigned as metal-to-ligand charge transfer bands. These features facilitate species identification in catalytic reaction mixtures.

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