Crystal Growth Studies on Microporous Zincophosphate-Faujasite Using Atomic Force Microscopy

2011 ◽  
Vol 11 (7) ◽  
pp. 3163-3171 ◽  
Author(s):  
Pablo Cubillas ◽  
Mark A. Holden ◽  
Michael W. Anderson
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Growth Studies

scholarly journals Crystal growth of the core and rotated epitaxial shell of a heterometallic metal-organic framework revealed with atomic force microscopy

2021 ◽  
Author(s):  
Fajar Inggit Pambudi ◽  
Michael William Anderson ◽  
Martin Attfield
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Metal Organic Framework ◽  
Metal Organic Frameworks ◽  
Force Microscopy ◽  
The Core ◽  
Atomic Force ◽  
Metal Organic ◽  
Surface Crystal ◽  
Organic Framework

Atomic force microscopy has been used to determine the surface crystal growth of two isostructural metal-organic frameworks, [Zn2(ndc)2(dabco)] (ndc = 1,4-naphthalene dicarboxylate, dabco = 4-diazabicyclo[2.2.2]octane) (1) and [Cu2(ndc)2(dabco)] (2) from...

Silicalite Crystal Growth Investigated by Atomic Force Microscopy

2003 ◽  
Vol 125 (3) ◽  
pp. 830-839 ◽  
Author(s):  
Jonathan R. Agger ◽  
Noreen Hanif ◽  
Colin S. Cundy ◽  
Andrew P. Wade ◽  
Sally Dennison ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Force Microscopy ◽  
Atomic Force

Imaging of crystal growth-induced fine surface features in zeolite A by atomic force microscopy

2002 ◽  
Vol 54 (1-2) ◽  
pp. 79-88 ◽  
Author(s):  
Seyda Dumrul ◽  
Stephane Bazzana ◽  
Juliusz Warzywoda ◽  
Ronald R Biederman ◽  
Albert Sacco
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Zeolite A ◽  
Surface Features ◽  
Force Microscopy ◽  
Atomic Force ◽  
Fine Surface

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys measured by Atomic Force Microscopy

2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Data Storage ◽  
Optical Data Storage ◽  
Crystal Nucleation ◽  
Ex Situ ◽  
Optical Data ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.

Sign in / Sign up

Export Citation Format

Share Document