scholarly journals Using Prior Knowledge in the Determination of Macromolecular Size-Distributions by Analytical Ultracentrifugation

2007 ◽  
Vol 8 (6) ◽  
pp. 2011-2024 ◽  
Author(s):  
Patrick H. Brown ◽  
Andrea Balbo ◽  
Peter Schuck
Keyword(s):  
Prior Knowledge ◽  
Analytical Ultracentrifugation ◽  
Size Distributions

Experimental Determination of Quantum Dot Size Distributions, Ligand Packing Densities, and Bioconjugation Using Analytical Ultracentrifugation

Nano Letters ◽  
2008 ◽  
Vol 8 (9) ◽  
pp. 2883-2890 ◽  
Author(s):  
Emma E. Lees ◽  
Menachem J. Gunzburg ◽  
Tich-Lam Nguyen ◽  
Geoffrey J. Howlett ◽  
Julie Rothacker ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Experimental Determination ◽  
Analytical Ultracentrifugation ◽  
Size Distributions ◽  
Packing Densities

Characterization and Manipulation of Exposed Ge Nanocrystals

2004 ◽  
Vol 818 ◽  
Author(s):  
I.D. Sharp ◽  
Q. Xu ◽  
C.Y. Liao ◽  
D.O. Yi ◽  
J.W. Ager ◽  
...  
Keyword(s):  
Hydrofluoric Acid ◽  
Metal Films ◽  
Silica Matrix ◽  
Size Distributions ◽  
Si Substrates ◽  
Atomic Force ◽  
Transmission Electron ◽  
Oxide Matrix ◽  
Ge Nanocrystals

AbstractIsotopically pure 70Ge and 74Ge nanocrystals embedded in SiO2 thin films on Si substrates have been fabricated through ion implantation and thermal annealing. Nanocrystals were subsequently exposed using a hydrofluoric acid etching procedure to selectively remove the oxide matrix while retaining up to 69% of the implanted Ge. Comparison of transmission electron micrographs (TEM) of as-grown crystals to atomic force microscope (AFM) data of exposed crystals reveals that the nanocrystal size distribution is very nearly preserved during etching. Therefore, this process provides a new means to use AFM for rapid and straightforward determination of size distributions of nanocrystals formed in a silica matrix. Once exposed, nanocrystals may be transferred to a variety of substrates, such as conducting metal films and optically transparent insulators for further characterization.

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