Apertureless Scanning Near-Field IR Microscopy for Chemical Imaging of Thin Films

Author(s):  
Boris B. Akhremitchev ◽  
Larissa Stebounova ◽  
Yujie Sun ◽  
Gilbert C. Walker
Langmuir ◽  
2008 ◽  
Vol 24 (13) ◽  
pp. 6946-6951 ◽  
Author(s):  
Kerstin Mueller ◽  
Xiujuan Yang ◽  
Melissa Paulite ◽  
Zahra Fakhraai ◽  
Nikhil Gunari ◽  
...  

2000 ◽  
Vol 88 (5) ◽  
pp. 2541-2547 ◽  
Author(s):  
N. Richard ◽  
A. Dereux ◽  
E. Bourillot ◽  
T. David ◽  
J. P. Goudonnet ◽  
...  

2009 ◽  
Vol 1222 ◽  
Author(s):  
Pengzhao Gao ◽  
Evgeny V. Rebrov ◽  
Jaap C. Schouten ◽  
Richard Kleismit ◽  
John Cetnar ◽  
...  

AbstractNanocrystalline Ni0.5Zn0.5Fe2O4 thin films have been synthesized with various grain sizes by sol–gel method on polycrystalline silicon substrates. The morphology and microwave absorption properties of the films calcined in the 673–1073 K range were studied by using XRD, AFM, near–field evanescent microwave microscopy, coplanar waveguide and direct microwave heating measurements. All films were uniform without microcracks. The increase of the calcination temperature from 873 to 1073 K and time from 1 to 3h resulted in an increase of the grain size from 12 to 27 nm. The complex permittivity of the Ni-Zn ferrite films was measured in the frequency range of 2–15 GHz. The heating behavior was studied in a multimode microwave cavity at 2.4 GHz. The highest microwave heating rate in the temperature range of 315–355 K was observed in the film close to the critical grain size of 21 nm in diameter marked by the transition from single– to multi–domain structure of nanocrystals in Ni0.5Zn0.5Fe2O4 film and by a maximum in its coercivity.


1999 ◽  
Vol 5 (S2) ◽  
pp. 970-971
Author(s):  
Dmitri A. Kossakovski ◽  
John D. Baldeschwieler ◽  
J. L. Beauchamp

Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning Infrared Microscopy and mass spectrometric analysis with laser ablation through fiber probes.In this contribution we report the development of a new method in this family of chemically sensitive scanning probe techniques: Laser Induced Breakdown Spectroscopy with Shear Force Microscopy, LIBS-SFM. Traditional LIBS experiments involve focusing a pulsed laser beam onto the sample and observing optical emission from the plasma formed in the ablation area. The emissions are mostly in the UV/visible range, and the signal is due to electronic transitions in excited atoms and ions in the plasma plume. The spectra are analyzed to identify chemical elements. The spatial resolution of LIBS is limited by the wavelength and beam quality of the laser used for ablation. The experiments may be conducted in vacuum, controlled atmosphere, or ambient air.


2012 ◽  
Vol 116 (45) ◽  
pp. 24206-24214 ◽  
Author(s):  
Bjoern Niesen ◽  
Barry P. Rand ◽  
Pol Van Dorpe ◽  
David Cheyns ◽  
Honghui Shen ◽  
...  

Author(s):  
M. Fujihira ◽  
S. Itoh ◽  
A. Takahara ◽  
O. Karthaus ◽  
S. Okazaki ◽  
...  

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