In situ Electrical Characterization of the Thickness Dependence of Organic Field-Effect Transistors with 1−20 Molecular Monolayer of Pentacene

2010 ◽  
Vol 2 (8) ◽  
pp. 2282-2288 ◽  
Author(s):  
Shun-Wei Liu ◽  
Chih-Chien Lee ◽  
Hung-Lin Tai ◽  
Je-Min Wen ◽  
Jiun-Haw Lee ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization ◽  
Thickness Dependence ◽  
Organic Field Effect Transistors

scholarly journals Inexpensive Measuring System for the Characterization of Organic Transistors

2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
Clara Pérez-Fuster ◽  
José Vicente Lidón-Roger ◽  
Laura Contat-Rodrigo ◽  
Eduardo García-Breijo
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization ◽  
Measuring System ◽  
Organic Transistors ◽  
Organic Field Effect Transistors ◽  
Organic Semiconductor Devices ◽  
Measuring Module ◽  
Four Quadrant

A measuring module has been specifically designed for the electrical characterization of organic semiconductor devices such as organic field effect transistors (OFETs) and organic electrochemical transistors (OECTs) according to the IEEE 1620-2008 standard. This device has been tested with OFETs based on 6,13-bis(triisopropylsilylethinyl)pentacene (TIPS-pentacene). The measuring system has been constructed using a NI-PXIe-1073 chassis with integrated controller and two NI-PXI-4132 programmable high-precision source measure units (SMUs) that offer a four-quadrant ± 100 V output, with resolution down to 10 pA. LabVIEW™ has been used to develop the appropriate program. Most of the main OFET parameters included in the IEEE 1620 standard can be measured by means of this device. Although nowadays expensive devices for the characterization of Si-based transistors are available, devices for the characterization of organic transistors are not yet widespread in the market. Fabrication of a specific and flexible module that can be used to characterize this type of transistors would provide a powerful tool to researchers.

In situ electrical characterization of DH4T field-effect transistors

2004 ◽  
Vol 146 (3) ◽  
pp. 317-320 ◽  
Author(s):  
T. Muck ◽  
V. Wagner ◽  
U. Bass ◽  
M. Leufgen ◽  
J. Geurts ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Electrical Characterization

Combined electrical and Raman characterization of C 60 -based organic field effect transistors

2003 ◽  
Author(s):  
Beynor A. Paez ◽  
Matthias Bartzsch ◽  
Georgeta Salvan ◽  
Reinhard Scholz ◽  
Thorsten U. Kampen ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors ◽  
Raman Characterization

scholarly journals Fabrication and characterization of solution-processed methanofullerene-based organic field-effect transistors

2005 ◽  
Vol 97 (8) ◽  
pp. 083714 ◽  
Author(s):  
Th. B. Singh ◽  
N. Marjanović ◽  
P. Stadler ◽  
M. Auinger ◽  
G. J. Matt ◽  
...  
Keyword(s):  
Field Effect ◽  
Field Effect Transistors ◽  
Organic Field Effect Transistors ◽  
Solution Processed ◽  
Fabrication And Characterization
Sign in / Sign up

Export Citation Format

Share Document