Full-Color Laser Displays Based on Optical Second-Harmonic Generation from the Thin Film Arrays of Selenium Nanowires

ACS Photonics ◽  
2021 ◽  
Author(s):  
Seung Won Jun ◽  
Sangheon Jeon ◽  
Junyoung Kwon ◽  
Jaebeom Lee ◽  
Chang-Seok Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Second Harmonic Generation ◽  
Harmonic Generation ◽  
Second Harmonic ◽  
Full Color ◽  
Optical Second Harmonic Generation ◽  
Selenium Nanowires

Optical second-harmonic generation in thin film systems

2008 ◽  
Vol 26 (6) ◽  
pp. 1519-1537 ◽  
Author(s):  
J. J. H. Gielis ◽  
P. M. Gevers ◽  
I. M. P. Aarts ◽  
M. C. M. van de Sanden ◽  
W. M. M. Kessels
Keyword(s):  
Thin Film ◽  
Second Harmonic Generation ◽  
Harmonic Generation ◽  
Second Harmonic ◽  
Optical Second Harmonic Generation

Optical second-harmonic generation in a thin-film waveguide without control of film thickness

1983 ◽  
Vol 45 (2) ◽  
pp. 80-83 ◽  
Author(s):  
Shinsuke Umegaki ◽  
Yoshinori Anabuki ◽  
Ken-ichi Ohta ◽  
Kyo Inoue ◽  
Shun-ichi Tanaka
Keyword(s):  
Thin Film ◽  
Second Harmonic Generation ◽  
Film Thickness ◽  
Harmonic Generation ◽  
Second Harmonic ◽  
Optical Second Harmonic Generation

Optical Second Harmonic Generation as a Tool for In Situ, Real-Time Monitor of Thin Film Epitaxial Growth

2014 ◽  
Vol 605 ◽  
pp. 223-226
Author(s):  
Andrea Rubano ◽  
Tim Günter ◽  
Martin Lilienblum ◽  
Domenico Paparo ◽  
Lorenzo Marrucci ◽  
...  
Keyword(s):  
Thin Film ◽  
Second Harmonic Generation ◽  
Real Time ◽  
Harmonic Generation ◽  
Second Harmonic ◽  
High Energy ◽  
Direct Access ◽  
Human Machine Interaction ◽  
Optical Second Harmonic Generation

Oxide-based hetero-structures are promising candidates for building the next generation of functional devices. In order to achieve this goal, it is required to have solid and reliable sensors for monitoring the growth of thin films with single-atomic-layer sensitivity. So far, the most popular in-situ diagnostic tool is Reflection High Energy Electron Diffraction, which provides information on the structural properties of the growing films, and not a direct access to the desired interfacial physical properties of interest. Furthermore, it needs a strong human-machine interaction, preventing its use into industrial mass production. Standard optics applied on buried interfaces suffers the disadvantage to have a probing depth which is orders of magnitude larger than the interface layer. Here we propose to overcome this problem by resorting to optical Second Harmonic Generation and we present some example to show the potential of this technique as a real-time monitor system for thin-film crystal growth.

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