scholarly journals Solid-State Solvation and Enhanced Exciton Diffusion in Doped Organic Thin Films under Mechanical Pressure

ACS Nano ◽  
2015 ◽  
Vol 9 (4) ◽  
pp. 4412-4418 ◽  
Author(s):  
Wendi Chang ◽  
Gleb M. Akselrod ◽  
Vladimir Bulović
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Organic Thin Films ◽  
Mechanical Pressure ◽  
Exciton Diffusion

Solid state cavity QED: Strong coupling in organic thin films

2007 ◽  
Vol 8 (2-3) ◽  
pp. 94-113 ◽  
Author(s):  
Jonathan R. Tischler ◽  
M. Scott Bradley ◽  
Qiang Zhang ◽  
Tolga Atay ◽  
Arto Nurmikko ◽  
...  
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Strong Coupling ◽  
Cavity Qed ◽  
Organic Thin Films

Exciton diffusion in light-emitting organic thin films studied by photocurrent spectra

2003 ◽  
Vol 83 (9) ◽  
pp. 1737-1739 ◽  
Author(s):  
C. L. Yang ◽  
Z. K. Tang ◽  
W. K. Ge ◽  
J. N. Wang ◽  
Z. L. Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Light Emitting ◽  
Exciton Diffusion ◽  
Photocurrent Spectra

Exciton diffusion in near-infrared absorbing solution-processed organic thin films

2013 ◽  
Vol 15 (8) ◽  
pp. 2867 ◽  
Author(s):  
H.-Y. Shin ◽  
J. H. Woo ◽  
M. J. Gwon ◽  
M. Barthelemy ◽  
M. Vomir ◽  
...  
Keyword(s):  
Thin Films ◽  
Near Infrared ◽  
Organic Thin Films ◽  
Solution Processed ◽  
Exciton Diffusion

Solid State Solvation in Amorphous Organic Thin Films

2003 ◽  
Vol 91 (24) ◽  
Author(s):  
Conor F. Madigan ◽  
Vladimir Bulović
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Organic Thin Films

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

The effects of metallic contacts on the lasing characteristics of organic thin films

2020 ◽  
Vol 13 (4) ◽  
pp. 866-872
Author(s):  
HAO Ya-ru ◽  
◽  
◽  
DENG Zhao-qi
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Metallic Contacts

scholarly journals Solid State NMR Spectroscopy a Valuable Technique for Structural Insights of Advanced Thin Film Materials: A Review

Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1494
Author(s):  
Mustapha El Hariri El Nokab ◽  
Khaled O. Sebakhy
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Solid State ◽  
Solid State Nmr ◽  
Pulse Sequences ◽  
3D Structure ◽  
Spectroscopic Techniques ◽  
Film Research ◽  
Versatile Technique ◽  
Work Done

Solid-state NMR has proven to be a versatile technique for studying the chemical structure, 3D structure and dynamics of all sorts of chemical compounds. In nanotechnology and particularly in thin films, the study of chemical modification, molecular packing, end chain motion, distance determination and solvent-matrix interactions is essential for controlling the final product properties and applications. Despite its atomic-level research capabilities and recent technical advancements, solid-state NMR is still lacking behind other spectroscopic techniques in the field of thin films due to the underestimation of NMR capabilities, availability, great variety of nuclei and pulse sequences, lack of sensitivity for quadrupole nuclei and time-consuming experiments. This article will comprehensively and critically review the work done by solid-state NMR on different types of thin films and the most advanced NMR strategies, which are beyond conventional, and the hardware design used to overcome the technical issues in thin-film research.

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