Co-registered Topographical, Band Excitation Nanomechanical, and Mass Spectral Imaging Using a Combined Atomic Force Microscopy/Mass Spectrometry Platform
Keyword(s):
1993 ◽
Vol 345
(8-9)
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pp. 615-617
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Keyword(s):
2015 ◽
Vol 2015
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pp. 1-12
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Keyword(s):
2009 ◽
Vol 23
(23)
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pp. 3781-3786
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2009 ◽
Vol 286
(1)
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pp. 11-16
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