Identifying Defect-Induced Trion in Monolayer WS2 via Carrier Screening Engineering
Keyword(s):
Keyword(s):
2016 ◽
Vol 4
(3)
◽
pp. 292-302
◽
2016 ◽
Vol 170
(2)
◽
pp. 293-294
◽
1998 ◽
Vol 158
(7)
◽
pp. 777
◽