Realization of Spatially Addressable Library by a Novel Combinatorial Approach on Atomic Layer Deposition: A Case Study of Zinc Oxide

2019 ◽  
Vol 21 (6) ◽  
pp. 445-455
Author(s):  
Harrison Sejoon Kim ◽  
Joy S. Lee ◽  
Si Joon Kim ◽  
Jaebeom Lee ◽  
Antonio T. Lucero ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Combinatorial Approach ◽  
Layer Deposition

scholarly journals ALD coating of centrifugally spun polymeric fibers and postannealing: case study for nanotubular TiO2 photocatalyst

2021 ◽  
Author(s):  
Martina Rihova ◽  
Oksana Yurkevich ◽  
Martin Motola ◽  
Ludek Hromadko ◽  
Zdeněk Spotz ◽  
...  
Keyword(s):  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Vinyl Pyrrolidone ◽  
Tio2 Photocatalyst ◽  
Polymeric Fibers ◽  
Layer Deposition ◽  
Centrifugal Spinning ◽  
Poly Vinyl Pyrrolidone

This work describes the synthesis of highly photocatalytically active TiO2 tubes (TiTBs) by combining centrifugal spinning and atomic layer deposition (ALD). Poly(vinyl pyrrolidone) (PVP) fibers were first produced by centrifugal...

Improving the photodetection and stability of a visible-light QDs/ZnO phototransistor via an Al2O3 additional layer

2021 ◽  
Author(s):  
Sungho Park ◽  
Byung Jun Kim ◽  
Tae Yeon Kim ◽  
Eui Young Jung ◽  
Kyu-Myung Lee ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Atomic Layer Deposition ◽  
Quantum Dot ◽  
Aluminum Oxide ◽  
Thin Layer ◽  
Visible Light ◽  
Atomic Layer ◽  
Zno Films ◽  
Additional Layer ◽  
Layer Deposition

We have developed a visible-light phototransistor with excellent photodetection characteristics and stability via atomic layer deposition (ALD) to add a thin layer of aluminum oxide (Al2O3) to quantum dot (QD)/zinc oxide (ZnO) films.

scholarly journals Kinetic Monte Carlo Study of the Atomic Layer Deposition of Zinc Oxide

2018 ◽  
Vol 122 (47) ◽  
pp. 27044-27058 ◽  
Author(s):  
Timo Weckman ◽  
Mahdi Shirazi ◽  
Simon D. Elliott ◽  
Kari Laasonen
Keyword(s):  
Monte Carlo ◽  
Zinc Oxide ◽  
Atomic Layer Deposition ◽  
Kinetic Monte Carlo ◽  
Monte Carlo Study ◽  
Atomic Layer ◽  
Layer Deposition

Atomic Layer Deposition of Gallium-Doped Zinc Oxide Transparent Conducting Oxide films

2011 ◽  
Vol 1315 ◽  
Author(s):  
Paul R. Chalker ◽  
Paul A. Marshall ◽  
Simon Romani ◽  
Matthew J. Rosseinsky ◽  
Simon Rushworth ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Atomic Layer Deposition ◽  
Film Thickness ◽  
Transparent Conducting Oxide ◽  
Oxide Films ◽  
Atomic Layer ◽  
Contactless Measurement ◽  
Zinc Oxide Films ◽  
Transparent Conducting ◽  
Layer Deposition

ABSTRACTThin transparent conducting oxide (TCO) films of gallium-doped zinc oxide have been deposited on glass substrates by atomic layer deposition (ALD) using diethyl zinc, triethyl gallium and water vapour as precursors. The gallium-doped zinc oxide films were deposited over the temperature range 100-350°C. Transmission electron microscopy reveals that the as-deposited films are polycrystalline in character. The electrical resistivity of the gallium-doped zinc oxide films was evaluated using four-point probe and contactless measurement methods as a function of film thickness. The lowest sheet resistance of 16 Ω/☐ was measured from a film thickness of 400nm and a gallium content of 5 atomic percent. The electron Hall mobility of this film was 12.3 cm2/Vs. The visible transmittance of the films was 78% with a haze of 0.2%.

scholarly journals RBS/Channeling Analysis of Zinc Oxide Films Grown at Low Temperature by Atomic Layer Deposition

2013 ◽  
Vol 123 (5) ◽  
pp. 899-903 ◽  
Author(s):  
R. Ratajczak ◽  
A. Stonert ◽  
E. Guziewicz ◽  
S. Gierałtowska ◽  
T.A. Krajewski ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Low Temperature ◽  
Atomic Layer Deposition ◽  
Oxide Films ◽  
Atomic Layer ◽  
Zinc Oxide Films ◽  
Layer Deposition

Iterative Reverse Monte Carlo and Molecular Statics for Improved Atomic Structure Modeling: A Case Study of Zinc Oxide Grown by Atomic Layer Deposition

2021 ◽  
Author(s):  
Ryan C Gettler ◽  
Henry D Koenig ◽  
Matthias J Young
Keyword(s):  
Monte Carlo ◽  
Zinc Oxide ◽  
Diffraction Data ◽  
Atomic Structure ◽  
Atomic Layer ◽  
Structure Modeling ◽  
Reverse Monte Carlo ◽  
Layer Deposition ◽  
Energetic Constraints

Reverse Monte Carlo (RMC) modeling is a common method to derive atomic structure models of materials from experimental diffraction data. However, RMC modeling does not impose energetic constraints and can...

Characteristics of Zinc-Oxide-Sulfide-Mixed Films Deposited by Using Atomic Layer Deposition

2008 ◽  
Vol 53 (6) ◽  
pp. 3287-3295 ◽  
Author(s):  
Sunyeol Jeon ◽  
Seokhwan Bang ◽  
Seungjun Lee ◽  
Semyung Kwon ◽  
Wooho Jeong ◽  
...  
Keyword(s):  
Zinc Oxide ◽  
Atomic Layer Deposition ◽  
Atomic Layer ◽  
Layer Deposition ◽  
Mixed Films
Sign in / Sign up

Export Citation Format

Share Document